J
Jeong-Tae Kim
Researcher at Pukyong National University
Publications - 162
Citations - 4094
Jeong-Tae Kim is an academic researcher from Pukyong National University. The author has contributed to research in topics: Structural health monitoring & Girder. The author has an hindex of 25, co-authored 157 publications receiving 3468 citations. Previous affiliations of Jeong-Tae Kim include Texas A&M University.
Papers
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Damage identification in beam-type structures: frequency-based method vs mode-shape-based method
TL;DR: In this paper, a frequency-based damage detection (FBDD) method was proposed to locate damage from changes in natural frequencies and a damage-sizing algorithm to estimate crack-size from natural frequency perturbation.
Field Verification of a Nondestructive Damage Localization and Severity Estimation Algorithm
TL;DR: An experiment to field-test an existing methodology for nondestructive damage localization in bridges and results indicate that the methodology accurately localizes the damage.
Journal ArticleDOI
Damage Localization in Structures Without Baseline Modal Parameters
Norris Stubbs,Jeong-Tae Kim +1 more
TL;DR: In this article, a methodology to localize and estimate the severity of damage in structures for which only post-damage modal parameters are available for a few vibrational modes is presented.
Journal ArticleDOI
Crack detection in beam-type structures using frequency data
Jeong-Tae Kim,Norris Stubbs +1 more
TL;DR: In this paper, a crack location model and a crack size model are formulated by relating fractional changes in modal energy to changes in natural frequencies due to damage such as cracks or other geometrical changes.
Journal ArticleDOI
Improved damage identification method based on modal information
Jeong-Tae Kim,Norris Stubbs +1 more
TL;DR: In this article, a newly derived algorithm to predict locations and severities of damage in structures using changes in modal characteristics is presented, which improved the accuracy of damage localization and severity estimation results in the test beam.