Showing papers by "Jerome H. Friedman published in 1986"

Data analysis in astronomy III

Abstract: In the book are reported the main results presented at the Third International Workshop on Data Analysis in Astronomy, held at the EUore Majorana Center for Scientific Culture, Erice, Sicily, Italy, on June 20-27,1988 The Workshop was the natural evolution of the two previous ones The main goal of the first edition (Erice 1984) was to start a scientific interaction between Astronomers and Computer Scientists Aim of the second (Erice 1986) was to look at the progress in data analysis methods and dedicated hardware technology Data analysis problems become harder whenever the data are poor in statistics or the signal is weak and embedded in structured background Experiments collecting data of such a nature require new and non-standard methodologies Possibilistic approaches could be merged with the statistical ones, in order to formalize all the knowledge used by the scientists to reach conclusions Moreover, the last decade has been characterized by very fast developments of Intelligent Systems for data analysis (knowledge based systems, ) that would be useful to support astronomers in complex decision making For these reasons, the last edition of the workshop was intended to provide an overview on the state of the art in the data analysis methodologies and tools in the new frontieres of the astrophysics (y-astronomy, neutrino astronomy, gravitational waves, background radiation and extreme cosmic ray energy spectrum) The book is organized in two sections: - Data analysis methods and tools, - New frontieres in astronomy

A Statistician’s View of Data Analysis

Abstract: A brief overview of statistical data analysis is provided with a view towards examining its role in the analysis of astronomy data.

Panel Discussion on Data Analysis Trends in X-Ray and Gamma-Ray Astronomy

Abstract: ZIMMERMANN: Let me begin the panel discussion on Data Analysis Trends in X-ray and Gamma-ray astronomy by first introducing the panel members These are from the left to the right: Roland Diehl, Ethan Schreier, Rosolino Buccheri, Livio Scarsi, Jean-Marc Chassery and Wolfgang Voges With the exception of Jean-Marc Chassery, who is an expert on image processing and statistical analysis, all the others have longer experience in the X-ray and Gamma-ray fields May I ask the speakers to keep their contributions to not more than five minutes, in order to allow ample room for discussion with the audience