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Jijun Feng

Researcher at University of Shanghai for Science and Technology

Publications -  39
Citations -  545

Jijun Feng is an academic researcher from University of Shanghai for Science and Technology. The author has contributed to research in topics: Beam splitter & Waveguide. The author has an hindex of 10, co-authored 37 publications receiving 341 citations. Previous affiliations of Jijun Feng include National Institute of Advanced Industrial Science and Technology.

Papers
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Fabrication of heterostructured p-CuO/n-SnO2 core-shell nanowires for enhanced sensitive and selective formaldehyde detection

TL;DR: In this paper, the p-CuO/n-SnO2 core-shell nanowires with precisely controlled shell thickness were synthesized through a sequential process combining a solution processing and atomic layer deposition.
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Investigation of growth characteristics, compositions, and properties of atomic layer deposited amorphous Zn-doped Ga2O3 films

TL;DR: In this paper, the Zn-doped Ga2O3 (ZGO) films were fabricated by a combination of PE-ALD of ZnO3 and TH-ALD with trimethylgallium and O2 plasma as a reactant for the plasmaenhanced atomic layer deposition (PE-ALD), respectively.
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Chemical, optical, and electrical characterization of Ga2O3 thin films grown by plasma-enhanced atomic layer deposition

TL;DR: In this article, thin Ga2O3 films were grown on Si (100) using trimethylgallium (TMG) and oxygen as the precursors through plasmaenhanced atomic layer deposition.
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Systematic Study of the SiOx Film with Different Stoichiometry by Plasma-Enhanced Atomic Layer Deposition and Its Application in SiOx/SiO2 Super-Lattice

TL;DR: More research is needed in order to decrease the x of SiOx film to a larger extent through further optimizing plasma-enhanced atomic layer deposition processes, and hence improve the photoluminescence properties of Si Ox/SiO2 super-lattices.
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A Three-Dimensional Silicon Nitride Polarizing Beam Splitter

TL;DR: In this paper, a 3D polarizing beam splitter based on a silicon nitride (Si3N4) vertical directional coupler is experimentally demonstrated, where a new planarization technique by incorporating conventional chemical-mechanical lapping with a dry-etching process is developed, in order to obtain a flat film surface for the second Si3N 4 core deposition after the first-layer waveguide is formed.