J
Jim Ciston
Researcher at National Center for Electron Microscopy
Publications - 162
Citations - 5807
Jim Ciston is an academic researcher from National Center for Electron Microscopy. The author has contributed to research in topics: Scanning transmission electron microscopy & Diffraction. The author has an hindex of 30, co-authored 134 publications receiving 3834 citations. Previous affiliations of Jim Ciston include Lawrence Berkeley National Laboratory & Center for Functional Nanomaterials.
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Electroreduction of carbon monoxide to liquid fuel on oxide-derived nanocrystalline copper
TL;DR: The results demonstrate the ability to change the intrinsic catalytic properties of Cu for this notoriously difficult reaction by growing interconnected nanocrystallites from the constrained environment of an oxide lattice, demonstrating the feasibility of a two-step conversion of CO2 to liquid fuel that could be powered by renewable electricity.
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Enhanced ferroelectricity in ultrathin films grown directly on silicon.
Suraj Cheema,Daewoong Kwon,Daewoong Kwon,Nirmaan Shanker,Roberto dos Reis,Shang-Lin Hsu,Shang-Lin Hsu,Jun Xiao,Haigang Zhang,Ryan Wagner,Adhiraj Datar,Margaret McCarter,Claudy Serrao,Ajay K. Yadav,Golnaz Karbasian,Cheng-Hsiang Hsu,Ava J. Tan,Li Chen Wang,Vishal Thakare,Xiang Zhang,Apurva Mehta,Evguenia Karapetrova,Rajesh V. Chopdekar,Padraic Shafer,Elke Arenholz,Elke Arenholz,Chenming Hu,Roger Proksch,Ramamoorthy Ramesh,Jim Ciston,Sayeef Salahuddin,Sayeef Salahuddin +31 more
TL;DR: This work shifts the search for the fundamental limits of ferroelectricity to simpler transition-metal oxide systems—that is, from perovskite-derived complex oxides to fluorite-structure binary oxides—in which ‘reverse’ size effects counterintuitively stabilize polar symmetry in the ultrathin regime.
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Unravelling surface and interfacial structures of a metal–organic framework by transmission electron microscopy
Yihan Zhu,Jim Ciston,Bin Zheng,Xiaohe Miao,Cory Czarnik,Yichang Pan,Rachid Sougrat,Zhiping Lai,Chia-En Hsiung,Ke Xin Yao,Ingo Pinnau,Ming Pan,Yu Han +12 more
TL;DR: This work uses a direct-detection electron-counting camera to acquire TEM images of the MOF ZIF-8 with an ultralow dose of 4.1 electrons per square ångström to retain the structural integrity, and reveals important local structural features of Zif-8 crystals that cannot be identified by diffraction techniques.
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Facile transformation of imine covalent organic frameworks into ultrastable crystalline porous aromatic frameworks.
Xinle Li,Changlin Zhang,Song-Liang Cai,Xiaohe Lei,Xiaohe Lei,Virginia Altoe,Fang Hong,Jeffrey J. Urban,Jim Ciston,Emory M. Chan,Yi Liu +10 more
TL;DR: A facile strategy is demonstrated that transforms imine-linked COFs into robust porous aromatic frameworks by kinetically fixing the reversible imine linkage via an aza-Diels-Alder cycloaddition reaction.
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Strain mapping at nanometer resolution using advanced nano-beam electron diffraction
V. B. Özdöl,Christoph Gammer,Christoph Gammer,Christoph Gammer,Xiuguang Jin,Peter Ercius,Colin Ophus,Jim Ciston,Andrew M. Minor,Andrew M. Minor +9 more
TL;DR: In this article, a nanometer scale strain mapping technique by means of scanning nano-beam electron diffraction has been proposed, with a high precision of 0.1% at a lateral resolution of 1 nm for a large field of view reaching up to 1 μm.