Jon Opsal

TL;DR: In this article, thermal wave detection and analysis can be performed, in a noncontact and highly sensitive manner, through the dependence of sample optical reflectance on temperature, which is demonstrated by an example of measuring the thickness of thin metal films.

TL;DR: A new technique has been developed that employs highly focused laser beams for both generating and detecting thermal waves in the megahertz frequency regime and includes a comprehensive 3-D depth-profiling theoretical model; it has been used to measure the thickness of both transparent and opaque thin films with high spatial resolution.

TL;DR: An optical measurement system for evaluating a reference sample that has at least a partially known composition is described in this paper, which includes a reference ellipsometer and at least one non-contact optical measurement device.

TL;DR: In this paper, a reference ellipsometer is used to calibrate the other optical measurement devices, which can be used to analyze multi-layer thin film stacks and to determine the total optical thickness of the stack.

TL;DR: In this article, a rotating compensator induces phase retardations of a polarization state of the light beam wherein the range of wavelengths and the compensator are selected such that at least a first phase retardation value is induced that is within a primary range of effective retardation of substantially 135° to 225°.