Joseph A. Turner

TL;DR: In this article, the complete flexural beam equation is examined and compared directly with the first-mode approximation (FMA) with both linear and nonlinear examples using both analytical and finite difference numerical techniques and it is shown that the higher modes must be included for excitations above the first resonance if both the low and high frequency dynamics are to be modeled accurately.

TL;DR: In this article, an atomic force acoustic microscopy (AFAM) method was used to determine the elastic properties of thin thin films by measuring the frequencies of an AFM cantilever's first two flexural resonances while in contact with a material.

TL;DR: In this paper, the authors present a quantitative method for determining the viscoelastic properties of materials with nanometer spatial resolution based on the atomic force acoustic microscopy technique that involves the resonant frequencies of the cantilever when its tip is in contact with a sample surface.

TL;DR: In this article, the sensitivity of the flexural and torsional modes of atomic force microscopy (AFM) probes to variations in surface stiffness has been investigated and closed-form expressions are derived for cantilevers with constant cross sections.

TL;DR: In this paper, the complete flexural beam equation is examined and compared directly with the FMA using both linear and nonlinear examples, and it is shown that the higher modes must be included for excitations above the first resonance if both the low and high frequency dynamics are to be modeled accurately.