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Jr. Sheldon B. Akers

Bio: Jr. Sheldon B. Akers is an academic researcher. The author has contributed to research in topics: Stone's representation theorem for Boolean algebras & Boolean circuit. The author has an hindex of 1, co-authored 1 publications receiving 197 citations.

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Book
01 Jan 2009
TL;DR: In this paper, the authors define testing as the process of applying a few well-defined, general-purpose test criteria to a structure or model of the software, and present an innovative approach to explaining the process.
Abstract: Extensively class tested, this text takes an innovative approach to explaining the process of software testing: it defines testing as the process of applying a few well-defined, general-purpose test criteria to a structure or model of the software. The structure of the text directly reflects the pedagogical approach and incorporates the latest innovations in testing, including techniques to test modern types of software such as OO, web applications, and embedded software.

1,126 citations

MonographDOI
01 Jan 2008
TL;DR: The structure of the text directly reflects the pedagogical approach and incorporates the latest innovations in testing, including techniques to test modern types of software such as OO, web applications and embedded software.
Abstract: Extensively class tested, this text takes an innovative approach to explaining the process of software testing: it defines testing as the process of applying a few well-defined, general-purpose test criteria to a structure or model of the software. The structure of the text directly reflects the pedagogical approach and incorporates the latest innovations in testing, including techniques to test modern types of software such as OO, web applications, and embedded software.

1,079 citations

Journal ArticleDOI
T. Larrabee1
TL;DR: The author describes the Boolean satisfiability method for generating test patterns for single stuck-at faults in combinational circuits, which allows for the addition of heuristics used by structural search methods, and has produced excellent results on popular test pattern generation benchmarks.
Abstract: The author describes the Boolean satisfiability method for generating test patterns for single stuck-at faults in combinational circuits. This new method generates test patterns in two steps: first, it constructs a formula expressing the Boolean difference between the unfaulted and faulted circuits, and second, it applies a Boolean satisfiability algorithm to the resulting formula. This approach differs from previous methods now in use, which search the circuit structure directly instead of constructing a formula from it. The new method is general and effective. It allows for the addition of heuristics used by structural search methods, and it has produced excellent results on popular test pattern generation benchmarks. >

704 citations

Journal ArticleDOI
Hurst1
TL;DR: This tutorial/survey paper will review the historical developments in this field, both in circuit realizations and in methods of handling multiple-valued design data, and consider the present state-of-the-art and future expectations.
Abstract: Multiple-valued logic, in which the number of discrete logic levels is not confined to two, has been the subject of much research over many years. The practical objective of this work has been to increase the information content of the digital signals in a system to a higher value than that provided by binary operation. In this tutorial/survey paper we will review the historical developments in this field, both in circuit realizations and in methods of handling multiple-valued design data, and consider the present state-of-the-art and future expectations.

489 citations

Journal ArticleDOI
01 Apr 1997
TL;DR: It is demonstrated that binary decision diagrams are an efficient representation for every special-case matrix in common use, notably sparse matrices, and that complete pivoting is no more difficult over these matrices than partial pivoting.
Abstract: In this paper, we discuss the use of binary decision diagrams to represent general matrices. We demonstrate that binary decision diagrams are an efficient representation for every special-case matrix in common use, notably sparse matrices. In particular, we demonstrate that for any matrix, the BDD representation can be no larger than the corresponding sparse-matrix representation. Further, the BDD representation is often smaller than any other conventional special-case representation: for the n×n Walsh matrix, for example, the BDD representation is of size O(log n). No other special-case representation in common use represents this matrix in space less than O(n²). We describe termwise, row, column, block, and diagonal selection over these matrices, standard an Strassen matrix multiplication, and LU factorization. We demonstrate that the complexity of each of these operations over the BDD representation is no greater than that over any standard representation. Further, we demonstrate that complete pivoting is no more difficult over these matrices than partial pivoting. Finally, we consider an example, the Walsh Spectrum of a Boolean function.

432 citations