A fast-Fourier-transform method of topography and interferometry is proposed. By computer processing of a noncontour type of fringe pattern, automatic discrimination is achieved between elevation and depression of the object or wave-front form, which has not been possible by the fringe-contour-generation techniques. The method has advantages over moire topography and conventional fringe-contour interferometry in both accuracy and sensitivity. Unlike fringe-scanning techniques, the method is easy to apply because it uses no moving components.

Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry

A self-scanned 1024 element photodiode array and minicomputer are used to measure the phase (wavefront) in the interference pattern of an interferometer to lambda/100. The photodiode array samples intensities over a 32 x 32 matrix in the interference pattern as the length of the reference arm is varied piezoelectrically. Using these data the minicomputer synchronously detects the phase at each of the 1024 points by a Fourier series method and displays the wavefront in contour and perspective plot on a storage oscilloscope in less than 1 min (Bruning et al. Paper WE16, OSA Annual Meeting, Oct. 1972). The array of intensities is sampled and averaged many times in a random fashion so that the effects of air turbulence, vibrations, and thermal drifts are minimized. Very significant is the fact that wavefront errors in the interferometer are easily determined and may be automatically subtracted from current or subsequent wavefrots. Various programs supporting the measurement system include software for determining the aperture boundary, sum and difference of wavefronts, removal or insertion of tilt and focus errors, and routines for spatial manipulation of wavefronts. FFT programs transform wavefront data into point spread function and modulus and phase of the optical transfer function of lenses. Display programs plot these functions in contour and perspective. The system has been designed to optimize the collection of data to give higher than usual accuracy in measuring the individual elements and final performance of assembled diffraction limited optical systems, and furthermore, the short loop time of a few minutes makes the system an attractive alternative to constraints imposed by test glasses in the optical shop.

Digital wavefront measuring interferometer for testing optical surfaces and lenses

Simulated annealing: Practice versus theory

The coupled-mode theory (CMT) for optical waveguides is reviewed, with emphasis on the analysis of coupled optical waveguides. A brief account of the recent development of the CMT for coupled optical waveguides is given. Issues raised in the debates of the 1980’s on the merits and shortcomings of the conventional as well as the improved coupled-mode formulations are discussed. The conventional coupled-mode formulations are set up in a simple, intuitive way. The rigorous CMT is established on the basis of a linear superposition of the modes for individual waveguides. The cross-power terms appear logically as a result of modal nonorthogonality. The cross power is necessary for the self-consistency of the CMT for dissimilar waveguides. The nonorthogonal CMT, though more complicated, yields more-accurate results than the conventional orthogonal CMT for most practical applications. It also leads to the prediction of cross talk in directional couplers. The conventional orthogonal CMT is, however, reliably accurate for describing the power coupling between two weakly coupled, nearly identical waveguides. For dissimilar waveguides, a self-consistent orthogonal CMT can be derived by a redefinition of the coupling coefficients, and it predicts the coupling length and therefore the power exchange between the waveguides accurately if the two waveguides are far apart. Three typical coupler configurations—the uniform, the grating-assisted, and the tapered—are examined in detail. The accuracy, scope of validity, limitations, and extensions of the coupled-mode formulations are discussed in conjunction with each configuration. To verify the arguments in the discussions, comparisons with the exact analytical solutions and the rigorous numerical simulations are made.

Coupled-mode theory for optical waveguides: an overview

The theory of image formation is formulated in terms of the coherence function in the object plane, the diffraction distribution function of the image-forming system and a function describing the structure of the object. There results a four-fold integral involving these functions, and the complex conjugate functions of the latter two. This integral is evaluated in terms of the Fourier transforms of the coherence function, the diffraction distribution function and its complex conjugate. In fact, these transforms are respectively the distribution of intensity in an 'effective source', and the complex transmission of the optical system-they are the data initially known and are generally of simple form. A generalized 'transmission factor' is found which reduces to the known results in the simple cases of perfect coherence and complete incoherence. The procedure may be varied in a manner more suited to non-periodic objects. The theory is applied to study inter alia the influence of the method of illumination on the images of simple periodic structures and of an isolated line.

On the diffraction theory of optical images

The third- and fifth-order wavelength-shift aberrations for an off-axis holographic zone plate for the higher orders are discussed, and numerical calculations of the aberrations are presented. A stigmatic point image can be obtained in the nth diffracted order if the wavelength-shift ratio is equal to 1/n.

Compensation Of Wavelength-Shift Aberrations In An Off-Axis Holographic Zone Plate

Image reconstruction by using the propagation law of mutual intensity

The behavior of the charge carriers in the thermoplastic-photoconductor system has been studied by the measurement of the diffraction efficiency instead of the usual current measurement, and the followings are found. (1) The charge carriers are injected from the transparent conductor to the photoconductor and the minus charge injection depth is estimated to 0.1 mu m for 1:10 TNF:PVK complex and 0.3 mu m for 4:10 TNF:PVK complex. (2) A kind of rectification effect is analogous to that of the p-type semiconductor-metal system exists at the photoconductor transparent conductor interface.

Microscopic response in thermoplastic-photoconductor media (behavior of charge carriers) (holographic recording)

Vibration measurement by vibrating-plate holograms

The restoration of linear-motion blurring by the convolution method, realized by scanning a picture to be processed with an aperture of special form, is considered. Effects of the operation range of convolution and of the width of a segment in the aperture upon the restoration are discussed. The influence of noise in restoration processing with typical apertures is also discussed.

Jumpei Tsujiuchi

Papers

Compensation Of Wavelength-Shift Aberrations In An Off-Axis Holographic Zone Plate

Image reconstruction by using the propagation law of mutual intensity

Microscopic response in thermoplastic-photoconductor media (behavior of charge carriers) (holographic recording)

Vibration measurement by vibrating-plate holograms

Restoration of Linear-motion Blurred Pictures by Image Scanning Method