J
Jun Fan
Researcher at Missouri University of Science and Technology
Publications - 505
Citations - 7033
Jun Fan is an academic researcher from Missouri University of Science and Technology. The author has contributed to research in topics: Printed circuit board & Equivalent circuit. The author has an hindex of 36, co-authored 482 publications receiving 5641 citations. Previous affiliations of Jun Fan include Ulsan National Institute of Science and Technology & University of Missouri.
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Patent
Reducing noise effects in circuit boards
TL;DR: In this article, a circuit board includes an assembly having first and second power reference plane layers, and an insulator layer between the second and third power reference planes, and discrete decoupling capacitors are further provided with the assembly.
Journal ArticleDOI
Prediction of Power Supply Noise From Switching Activity in an FPGA
Liehui Ren,Tun Li,Sandeep Chandra,Xiaohe Chen,Hemant Bishnoi,Shishuang Sun,Peter Boyle,Iliya Zamek,Jun Fan,Daryl G. Beetner,James L. Drewniak +10 more
TL;DR: In this paper, a methodology is developed for predicting dynamic power supply noise on the printed circuit board (PCB) resulting from logic activity in a field-programmable gate array (FPGA).
Journal ArticleDOI
Review of the EMC Aspects of Internet of Things
TL;DR: In this article, the authors discuss the radio receiver desensitization and coexistence aspects of IoT devices and provide a means of device performance evaluation and electromagnetic interference troubleshooting for single-input single-output (SISO) and MIMO devices.
Journal ArticleDOI
Inductance Extraction for PCB Prelayout Power Integrity Using PMSR Method
Ying S. Cao,Tamar Makharashvili,Jonghyun Cho,Siqi Bai,Samuel Connor,Bruce Archambeault,Li Jun Jiang,Albert E. Ruehli,Jun Fan,James L. Drewniak +9 more
TL;DR: In this article, a physics-based model size reduction (PMSR) method is applied to get the equivalent circuit model for the above-ground geometries, which can be used in analyzing the structure in its parts.
Proceedings ArticleDOI
Measurement validation of the dipole-moment model for IC radiated emissions
TL;DR: In this article, a procedure is proposed to extract equivalent dipole-moment model for the real integrated circuit (IC) from the near-field scanning data, which can be applied to take the place of real IC in the full-wave simulation tools, to predict the IC's radiated emissions with the presence of other structures.