J
Jun Fan
Researcher at Missouri University of Science and Technology
Publications - 505
Citations - 7033
Jun Fan is an academic researcher from Missouri University of Science and Technology. The author has contributed to research in topics: Printed circuit board & Equivalent circuit. The author has an hindex of 36, co-authored 482 publications receiving 5641 citations. Previous affiliations of Jun Fan include Ulsan National Institute of Science and Technology & University of Missouri.
Papers
More filters
Journal ArticleDOI
Determining Equivalent Dipoles Using a Hybrid Source-Reconstruction Method for Characterizing Emissions from Integrated Circuits
TL;DR: In this article, the authors proposed a hybrid equivalent source model for radiation problems in integrated circuits (ICs), which is based on two sets of equivalent dipoles, one is converted directly from the current/voltage information distributed along the IC package, while the other initially is solved from linear equations that describe the relationship between the dipoles and scanned fields.
Proceedings ArticleDOI
Measurement of multiple switching current components through a bulk decoupling capacitor using a lab-made low-cost current probe
Liang Li,Jingook Kim,Hanfeng Wang,Songping Wu,Yuzo Takita,Hayato Takeuchi,Kenji Araki,Jun Fan +7 more
TL;DR: In this paper, a measurement-based data-processing approach to obtain parameters of multiple current components through a bulk decoupling capacitor for power integrity studies is presented, where a lab-made low-cost current probe is developed to measure the induced voltage due to the time-varying switching current.
Proceedings ArticleDOI
A Cross-sectional Profile Based Model for Stripline Conductor Surface Roughness
Shaohui Yong,Victor Khilkevich,Yuanzhuo Liu,Ruijie He,Yuandong Guo,Han Gao,Scott Hinaga,Darja Padilla,Douglas Yanagawa,Jun Fan,James L. Drewniak +10 more
TL;DR: In this article, an investigation of the scattering by metal hemispheres, including their interaction, is performed, and a method is brought up to estimate the multi-level physical model's parameters using the scanning electron microscope (SEM) or optical cross-sectional profile imaging.
Proceedings ArticleDOI
Far-field radiation estimation from near-field measurements and image theory
TL;DR: In this article, the authors proposed a near-field to far-field transformation method for the radiation sources located on a large ground plane, based on the Huygens principle and image theory.
Proceedings ArticleDOI
DC blocking via structure optimization and measurement correlation for SerDes channels
TL;DR: A via optimization tool, based on the cavity resonance algorithm to speed up the optimization, is used to obtain the optimized parameters for the two blocking via structures, and the following full-wave simulations give further performance explorations of the two via structures.