J
Jun Fan
Researcher at Missouri University of Science and Technology
Publications - 505
Citations - 7033
Jun Fan is an academic researcher from Missouri University of Science and Technology. The author has contributed to research in topics: Printed circuit board & Equivalent circuit. The author has an hindex of 36, co-authored 482 publications receiving 5641 citations. Previous affiliations of Jun Fan include Ulsan National Institute of Science and Technology & University of Missouri.
Papers
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Proceedings ArticleDOI
Root Cause Analysis Methodology of ESD Soft-Failure Applied to a Robot
TL;DR: A case study is investigated where a methodology is developed to help system designers to understand and model the cause of the sensor failure during an ESD event and this methodology will also helpSystem designers to design efficient filters on the critical signal lines to minimize the effect of coupled noise.
An Empirical Modeling of Far-End Crosstalk and Insertion Loss in Microstrip Lines
Yuan-hai Liu,Shaohui Yong,Yuandong Guo,Jiayi He,Chaofeng Li,Xiaoning Ye,Jun Fan,Victor Khilkevich,DongHyun Kim +8 more
TL;DR: In this paper , an extraction method with high accuracy is proposed to characterize the dielectric material and foil surface roughness properties from the measured S-parameters with known cross-sectional geometry up to 20 GHz.
Proceedings ArticleDOI
The design of a lumped element impedance-matching network with reduced parasitic effects obtained from numerical modeling
TL;DR: In this article, the authors present an impedance-matching network design with numerical modeling of the parasitic effects of surface mount technology (SMT) resistors for impedance matching networks.
Proceedings ArticleDOI
Design of on-chip linear voltage regulator module and measurement of power distribution network noise fluctuation at high-speed output buffer
Manho Lee,Heegon Kim,Sukjin Kim,Joungho Kim,Jonghyun Cho,Changwook Yoon,Brice Achkir,Jingook Kim,Jun Fan +8 more
TL;DR: The advantages of on-chip linear VRM are validated by measuring fabricated chip and showing PDN self-impedance at output buffer by simulation with designed PCB's S-parameter, and eye-diagram power fluctuation up to 1 Gbps.
Proceedings ArticleDOI
EMI Investigation and Mitigation of Flexible Flat Cables and Connectors
TL;DR: In this paper, the authors investigated the common mode noise generated from flexible flat cable (FFC) and related connectors and identified the main cause of the ground discontinuity and the related voltage difference between the PCB ground and the FFC ground.