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Jürgen Off

Other affiliations: Osram Opto Semiconductors GmbH
Bio: Jürgen Off is an academic researcher from University of Stuttgart. The author has contributed to research in topics: Quantum well & Metalorganic vapour phase epitaxy. The author has an hindex of 18, co-authored 55 publications receiving 1542 citations. Previous affiliations of Jürgen Off include Osram Opto Semiconductors GmbH.

Papers published on a yearly basis

Papers
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Journal ArticleDOI
TL;DR: In this paper, the authors demonstrate a dramatic reduction of the oscillator strength in quantum wells due to piezoelectric fields, showing a strong increase of the luminescence decay time of the dominating transition with increasing well width in parallel to a redshift of the emission peaks.
Abstract: We demonstrate a dramatic reduction of the oscillator strength in ${\mathrm{G}\mathrm{a}\mathrm{N}/\mathrm{A}\mathrm{l}}_{x}{\mathrm{Ga}}_{1\ensuremath{-}x}\mathrm{N}$ quantum wells due to piezoelectric fields. Our study using time-resolved photoluminescence spectroscopy reveals a strong increase of the luminescence decay time of the dominating transition with increasing well width by several orders of magnitude in parallel to a redshift of the emission peaks. The experimental results are consistently explained by a quantitative model based on the piezoelectric fields in strained wurtzite quantum wells. We estimate the piezoelectric constant of GaN to ${d}_{31}=\ensuremath{-}0.9\ifmmode\times\else\texttimes\fi{}{10}^{\ensuremath{-}10}$ cm/V.

568 citations

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TL;DR: In this article, the authors focus on the consequences of the piezoelectric field, which is an inherent consequence of the commonly used wurtzite phase of GaN, on the optical properties of strained GaN-based quantum well structures.
Abstract: In this contribution, we focus on the consequences of the piezoelectric field, which is an inherent consequence of the commonly used wurtzite phase of GaN, on the optical properties of strained GaN-based quantum well structures. We demonstrate that both in GaN/AlGaN and in GaInN/GaN single quantum well structures, the piezoelectric field leads to a Stark-shift of the fundamental optical transitions, which can lead to luminescence emission far below the bulk bandgap. Due to the spatial separation of the electron and hole wavefunctions in such structures, the oscillator strength of these transitions may become extremely small, many orders of magnitude lower than in the field-free case. From specially designed structures, we can even determine the sign of the piezoelectric field and relate it to the polarity of the layers. Under high-excitation conditions, as found in a laser diode, the piezoelectric field is almost completely screened by the injected carriers. As a consequence, the stimulated emission is significantly blue-shifted compared to the photoluminescence, which has sometimes been confused with localization effects.

135 citations

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TL;DR: In this paper, the Mott transition between an excitonic recombination to a plasma-type recombination was studied in GaN and the carrier density at this point was shown to be higher than the lattice temperature.
Abstract: Photoluminescence under intense excitation is studied in GaN. As the excitation density increases, we show the Mott transition between an excitonic recombination to a plasma-type recombination. The carrier density at the Mott transition is given. At and above the Mott density, we show that the carrier temperature is higher than the lattice temperature. The energy relaxation of the hot plasma is shown to be dominated by LO-phonon emission. Coulomb screening and band-gap renormalization are observed from the photoluminescence peak position and the measured renormalization factor is in good agreement with elementary many-body theory. Finally the dependence of the Mott density on carrier temperature is shown to follow a Debye-H\"uckel model.

104 citations

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TL;DR: In this article, optical phonon frequency studies in anisotropicically strained c -plane and a -plane-oriented GaN films by generalized infrared spectroscopic ellipsometry and Raman scattering spectroscopy were performed.
Abstract: We report optical phonon frequency studies in anisotropically strained c -plane- and a -plane-oriented GaN films by generalized infrared spectroscopic ellipsometry and Raman scattering spectroscopy. The anisotropic strain in the films is obtained from high-resolution x-ray diffraction measurements. Experimental evidence for splitting of the GaN E1 (TO), E1 (LO), and E2 phonons under anisotropic strain in the basal plane is presented, and their phonon deformation potentials c E1 (TO), c E1 (LO), and c E2 are determined. A distinct correlation between anisotropic strain and the A1 (TO) and E1 (LO) frequencies of a -plane GaN films reveals the a A1 (TO), b A1 (TO), a E1 (LO), and b E1 (LO) phonon deformation potentials. The a A1 (TO) and b A1 (TO) are found to be in very good agreement with previous results from Raman experiments. Our a A1 (TO) and a E1 (LO) phonon deformation potentials agree well with recently reported theoretical estimations, while b A1 (TO) and b E1 (LO) are found to be significantly larger than the theoretical values. A discussion of the observed differences is presented. © 2007 The American Physical Society.

94 citations

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TL;DR: In this paper, the structural quality, lattice constants, strain, and indium composition of 100 nm thick films with In concentrations up to 33% were evaluated by measuring symmetric (00.2) and asymmetric (20.5) reflexes.
Abstract: Wurtzite InGaN thin films grown by metalorganic chemical vapor deposition on sapphire substrates with and without GaN buffer layers are investigated by high-resolution x-ray diffraction measurements. The structural quality, lattice constants, strain, and indium composition of 100 nm thick films with In concentrations up to 33% are evaluated by measuring symmetric (00.2) and asymmetric (20.5) reflexes. The quality of the InGaN layers with widely different biaxial stress is measured and compared. An analytical solution for the determination of the In content of strained epitaxial layers is introduced. The results show that neglecting the strain can result in a severe miscalculation of the In concentration.

59 citations


Cited by
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Journal ArticleDOI
TL;DR: In this article, the authors investigated the role of spontaneous and piezoelectric polarization on the carrier confinement at GaN/AlGaN and AlGaN/GaN interfaces.
Abstract: Carrier concentration profiles of two-dimensional electron gases are investigated in wurtzite, Ga-face AlxGa1−xN/GaN/AlxGa1−xN and N-face GaN/AlxGa1−xN/GaN heterostructures used for the fabrication of field effect transistors. Analysis of the measured electron distributions in heterostructures with AlGaN barrier layers of different Al concentrations (0.15

2,581 citations

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TL;DR: In this paper, a comprehensive and up-to-date compilation of band parameters for all of the nitrogen-containing III-V semiconductors that have been investigated to date is presented.
Abstract: We present a comprehensive and up-to-date compilation of band parameters for all of the nitrogen-containing III–V semiconductors that have been investigated to date. The two main classes are: (1) “conventional” nitrides (wurtzite and zinc-blende GaN, InN, and AlN, along with their alloys) and (2) “dilute” nitrides (zinc-blende ternaries and quaternaries in which a relatively small fraction of N is added to a host III–V material, e.g., GaAsN and GaInAsN). As in our more general review of III–V semiconductor band parameters [I. Vurgaftman et al., J. Appl. Phys. 89, 5815 (2001)], complete and consistent parameter sets are recommended on the basis of a thorough and critical review of the existing literature. We tabulate the direct and indirect energy gaps, spin-orbit and crystal-field splittings, alloy bowing parameters, electron and hole effective masses, deformation potentials, elastic constants, piezoelectric and spontaneous polarization coefficients, as well as heterostructure band offsets. Temperature an...

2,525 citations

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TL;DR: In this paper, the structural and point defects caused by lattice and stacking mismatch with substrates are discussed. But even the best of the three binaries, InN, AIN and AIN as well as their ternary compounds, contain many structural defects, and these defects notably affect the electrical and optical properties of the host material.
Abstract: Gallium nitride (GaN) and its allied binaries InN and AIN as well as their ternary compounds have gained an unprecedented attention due to their wide-ranging applications encompassing green, blue, violet, and ultraviolet (UV) emitters and detectors (in photon ranges inaccessible by other semiconductors) and high-power amplifiers. However, even the best of the three binaries, GaN, contains many structural and point defects caused to a large extent by lattice and stacking mismatch with substrates. These defects notably affect the electrical and optical properties of the host material and can seriously degrade the performance and reliability of devices made based on these nitride semiconductors. Even though GaN broke the long-standing paradigm that high density of dislocations precludes acceptable device performance, point defects have taken the center stage as they exacerbate efforts to increase the efficiency of emitters, increase laser operation lifetime, and lead to anomalies in electronic devices. The p...

1,724 citations

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TL;DR: In this article, the chemical and thermal stability of epitaxial nitride films is discussed in relation to the problems of deposition processes and the advantages for applications in high-power and high-temperature devices.
Abstract: Recent research results pertaining to InN, GaN and AlN are reviewed, focusing on the different growth techniques of Group III-nitride crystals and epitaxial films, heterostructures and devices. The chemical and thermal stability of epitaxial nitride films is discussed in relation to the problems of deposition processes and the advantages for applications in high-power and high-temperature devices. The development of growth methods like metalorganic chemical vapour deposition and plasma-induced molecular beam epitaxy has resulted in remarkable improvements in the structural, optical and electrical properties. New developments in precursor chemistry, plasma-based nitrogen sources, substrates, the growth of nucleation layers and selective growth are covered. Deposition conditions and methods used to grow alloys for optical bandgap and lattice engineering are introduced. The review is concluded with a description of recent Group III-nitride semiconductor devices such as bright blue and white light-emitting diodes, the first blue-emitting laser, high-power transistors, and a discussion of further applications in surface acoustic wave devices and sensors.

1,386 citations

Journal ArticleDOI
TL;DR: A redshift that is strongly dependent on pump power supports the idea that the electron–hole plasma mechanism is primarily responsible for the gain at room temperature and is a considerable advance towards the realization of electron-injected, nanowire-based ultraviolet–blue coherent light sources.
Abstract: There is much current interest in the optical properties of semiconductor nanowires, because the cylindrical geometry and strong two-dimensional confinement of electrons, holes and photons make them particularly attractive as potential building blocks for nanoscale electronics and optoelectronic devices, including lasersand nonlinear optical frequency converters. Gallium nitride (GaN) is a wide-bandgap semiconductor of much practical interest, because it is widely used in electrically pumped ultraviolet-blue light-emitting diodes, lasers and photodetectors. Recent progress in microfabrication techniques has allowed stimulated emission to be observed from a variety of GaN microstructures and films. Here we report the observation of ultraviolet-blue laser action in single monocrystalline GaN nanowires, using both near-field and far-field optical microscopy to characterize the waveguide mode structure and spectral properties of the radiation at room temperature. The optical microscope images reveal radiation patterns that correlate with axial Fabry-Perot modes (Q approximately 10(3)) observed in the laser spectrum, which result from the cylindrical cavity geometry of the monocrystalline nanowires. A redshift that is strongly dependent on pump power (45 meV microJ x cm(-2)) supports the idea that the electron-hole plasma mechanism is primarily responsible for the gain at room temperature. This study is a considerable advance towards the realization of electron-injected, nanowire-based ultraviolet-blue coherent light sources.

1,207 citations