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K. Reimann

Researcher at NXP Semiconductors

Publications -  1
Citations -  15

K. Reimann is an academic researcher from NXP Semiconductors. The author has contributed to research in topics: Resistor & Capacitor. The author has an hindex of 1, co-authored 1 publications receiving 13 citations.

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Proceedings ArticleDOI

Reducing AC impedance measurement errors caused by the DC voltage dependence of broadband high-voltage bias-tees

TL;DR: A bias-tee has been developed with a voltage-independent capacitor, suitable for DC voltages up to 500 V showing excellent performance up to several gigahertz, and a calibration technique with applied bias significantly improves the measurement accuracy.