K.S. Champlin

Bio: K.S. Champlin is an academic researcher. The author has contributed to research in topics: Reflection (physics). The author has an hindex of 1, co-authored 1 publications receiving 31 citations.

Accurate determination of the complex permittivity of materials with transmission reflection measurements in partially filled rectangular waveguides

Abstract: An enhanced transmission reflection technique for the precise determination of the complex permittivity of dielectric materials partially filling the cross section of a rectangular waveguide is described Dielectric properties are determined by an iterative procedure from two-port S-parameter measurements and a numerically generated propagation constant obtained from the analysis of a partially filled waveguide Convergence of the solution is ensured from perturbational approximations Unlike previous approaches, an uncertainty investigation is performed, taking into account all the parameters involved in the dielectric characterization Permittivity accuracy values are presented and, hence, an optimum measurement setup can be established Measurements of reference materials have been carried out to validate the method

The Stripline Circulator: Theory and Practice

Abstract: This chapter contains sections titled: Complex Gyrator Circuit of Weakly Magnetized Junction Circulator Very Weakly Magnetized Gyromagnetic Resonator Weakly Magnetized Gyromagnetic Resonator Moderately Magnetized Gyromagnetic Resonator The Degree-2 Circulator Gap Effects in Circulator Assemblies Suspended Planar Resonator Passband Frequencies of a Three-Port Junction in Immittance Plane Open Walls Spinwave Instability in Magnetic Insulators Frequency Doubling in Ferrites Second-Order Intermodulation in Magnetic Insulators Temperature Stability of Magnetic Insulators Below the Kittel Line Third-Order Intermodulation Products in Nonlinear Devices

An uncertainty analysis for the measurement of intrinsic properties of materials by the combined transmission-reflection method

Abstract: The uncertainty of measurements of the complex permittivity epsilon /sub r/ and permeability mu /sub r/ as a function of the normalized sample length l/ Lambda ' due to the measured errors in the scattering coefficients S/sub 11/ and S/sub 21/ is discussed. A simple analysis of epsilon /sub r/ and mu /sub r/ and some measured data are given, which allows one to determine the extent of l/ Lambda ' and maximum uncertainty of the combined total transmission-reflection method in application to radar absorber measurements. >

TEMPERATURE DEPENDENCE OF THE MICROWAVE DIELECTRIC CONSTANT OF THE GaAs LATTICE

Abstract: The relative dielectric constant er of high‐resistivity GaAs has been measured at 70.243 GHz as a function of temperature between 100 and 300°K. The measuring technique utilized a circular E field (TE°01) mode reflection‐coefficient bridge. Estimated relative and absolute accuracies of the measurements are ±0.2% and ±0.5%, respectively. The results are found to fit the equation er(T) = er(0){1 + αT} where er(0) = 12.73 ±.07 and α = (1.2 ± 0.1) × 10−4. At room temperature (295°K) the relative permittivity is er = 13.18 ±.07.