Kaushik Chatterjee

Bio: Kaushik Chatterjee is an academic researcher from FM Global. The author has contributed to research in topics: Boiler (power generation) & Supply chain. The author has an hindex of 4, co-authored 6 publications receiving 78 citations. Previous affiliations of Kaushik Chatterjee include University of Maryland, College Park.

Semiconductor Manufacturers' Efforts to Improve Trust in the Electronic Part Supply Chain

Abstract: One of the major problem areas in the electronic part supply chain is the issue of counterfeit electronic parts and the risks associated with them. Guidelines are needed for detecting, avoiding, and preventing the use of counterfeits in order to mitigate the risks associated with such parts. As part of this effort, we have identified the role of part manufacturers in building trust in the supply chain. Part manufacturers, as the brand owners and trademark holders, play a critical role in enhancing trust in the electronic part supply chain.

A Probabilistic Physics-of-Failure Approach to Prediction of Steam Generator Tube Rupture Frequency

Abstract: In probabilistic safety assessments of pressurized water reactors, it is imperative to assess the potential and frequency of steam generator tube ruptures. Estimation of the frequency of steam generator tube ruptures has traditionally been based on historical occurrences, which are not applicable to new designs of steam generators with different geometries, material properties, degradation mechanisms, and thermal-hydraulic behaviors. This paper presents a new probabilistic mechanistic-based approach for estimating steam generator tube rupture frequency that is based on the principle that the failure of passive systems is governed by degradation or unfavorable conditions created through the underlying operating conditions and underlying mechanical, electrical, thermal, and chemical processes. This developed approach identifies, probabilistically models, and simulates potential degradations in new and existing steam generator designs to assess degradation versus time, until such degradation exceeds a known endurance limit. An example application of the proposed reliability prediction approach is presented for a new design of small modular reactor steam generators consisting of helically coiled tubes fabricated with advanced tube materials. This developed probabilistic physics-of-failure―based approach, when combined with probabilistic safety assessment techniques, can provide an effective tool for the evaluation of the safety and reliability of steam generators, particularly new steam generator designs used in advanced reactors.

Celebrating fifty years of physics of failure

Abstract: The year 2012 marked the fiftieth anniversary of the physics of failure concept since it was first introduced in 1962 by the Rome Air Development Center (now known as the Air Force Research Laboratory). A chronological description of the important historical events that led to the birth and subsequent advancement of physics of failure concept over the last fifty years has been presented in this paper. Alongside, a review of physics of failure concepts and methodologies as they evolved in the last fifty years has also been provided.

A probabilistic approach for estimating defect size and density considering detection uncertainties and measurement errors

Abstract: Every structural component has some form and amount of hidden defects, however small it might be. These defects should be detected and characterized in order to ensure reliability of safety-critica...

A Bayesian Probabilistic Approach to Improved Health Management of Steam Generator Tubes

Abstract: Steam generator tube integrity is critical for the safety and operability of pressurized water reactors. Any degradation and rupture of tubes can have catastrophic consequences, e.g., release of radioactivity into the atmosphere. Given the risk significance of steam generator tube ruptures, it is necessary to periodically inspect the tubes using nondestructive evaluation methods to detect and characterize unknown existing defects. To make accurate estimates of defect size and density, it is essential that detection uncertainty and measurement errors associated with nondestructive evaluation methods are characterized properly and accounted for in the evaluation. In this paper we propose a Bayesian approach that updates prior knowledge of defect size and density with nondestructive evaluation data, accounting for detection uncertainty and measurement errors. An example application of the proposed approach is then demonstrated for estimating defect size and density in steam generator tubes using eddy current evaluation data. The proposed Bayesian probabilistic approach helps improve health management of steam generator tubes, thereby enhancing the overall safety and operability of pressurized water reactors.

Transitioning to Physics-of-Failure as a Reliability Driver in Power Electronics

Abstract: Power electronics has progressively gained an important status in power generation, distribution, and consumption. With more than 70% of electricity processed through power electronics, recent research endeavors to improve the reliability of power electronic systems to comply with more stringent constraints on cost, safety, and availability in various applications. This paper serves to give an overview of the major aspects of reliability in power electronics and to address the future trends in this multidisciplinary research direction. The ongoing paradigm shift in reliability research is presented first. Then, the three major aspects of power electronics reliability are discussed, respectively, which cover physics-of-failure analysis of critical power electronic components, state-of-the-art design for reliability process and robustness validation, and intelligent control and condition monitoring to achieve improved reliability under operation. Finally, the challenges and opportunities for achieving more reliable power electronic systems in the future are discussed.

A Primer on Hardware Security: Models, Methods, and Metrics

Abstract: The multinational, distributed, and multistep nature of integrated circuit (IC) production supply chain has introduced hardware-based vulnerabilities. Existing literature in hardware security assumes ad hoc threat models, defenses, and metrics for evaluation, making it difficult to analyze and compare alternate solutions. This paper systematizes the current knowledge in this emerging field, including a classification of threat models, state-of-the-art defenses, and evaluation metrics for important hardware-based attacks.

Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain

Abstract: As the electronic component supply chain grows more complex due to globalization, with parts coming from a diverse set of suppliers, counterfeit electronics have become a major challenge that calls for immediate solutions. Currently, there are a few standards and programs available that address the testing for such counterfeit parts. However, not enough research has yet addressed the detection and avoidance of all counterfeit partsVrecycled, remarked, overproduced, cloned, out-of-spec/defective, and forged documentationVcurrently infiltrating the electronic component supply chain. Even if they work initially, all these parts may have reduced lifetime and pose reliability risks. In this tutorial, we will provide a review of some of the existing counterfeit detection and avoidance methods. We will also discuss the challenges ahead for im- plementing these methods, as well as the development of new detection and avoidance mechanisms.

Flow-induced vibration

Abstract: Structural vibrations caused by a flowing fluid. Whenever a structure is exposed to a flowing fluid,…

Provably Secure Active IC Metering Techniques for Piracy Avoidance and Digital Rights Management

Abstract: In the horizontal semiconductor business model where the designer's intellectual property (IP) is transparent to foundry and to other entities on the production chain, integrated circuits (ICs) overbuilding and IP piracy are prevalent problems. Active metering is a suite of methods enabling the designers to control their chips postfabrication. We provide a comprehensive description of the first known active hardware metering method and introduce new formal security proofs. The active metering method uniquely and automatically locks each IC upon manufacturing, such that the IP rights owner is the only entity that can provide the specific key to unlock or otherwise control each chip. The IC control mechanism exploits: 1) the functional description of the design, and 2) unique and unclonable IC identifiers. The locks are embedded by modifying the structure of the hardware computation model, in the form of a finite state machine (FSM). We show that for each IC hiding the locking states within the modified FSM structure can be constructed as an instance of a general output multipoint function that can be provably efficiently obfuscated. The hidden locks within the FSM may also be used for remote enabling and disabling of chips by the IP rights owner during the IC's normal operation. An automatic synthesis method for low overhead hardware implementation is devised. Attacks and countermeasures are addressed. Experimental evaluations demonstrate the low overhead of the method. Proof-of-concept implementation on the H.264 MPEG decoder automatically synthesized on a Xilinix Virtex-5 field-programmable gate array (FPGA) further shows the practicality, security, and the low overhead of the new method.