The measurement of similarity between trajectories of vessels is one of the kernel problems that must be addressed to promote the development of maritime intelligent traffic system (ITS). In this study, a new model of trajectory similarity measurement was established to improve the data processing efficiency in dynamic application and to reflect actual sailing behaviors of vessels. In this model, a feature point detection algorithm was proposed to extract feature points, reduce data storage space and save computational resources. A new synthesized distance algorithm was also created to measure the similarity between trajectories by using the extracted feature points. An experiment was conducted to measure the similarity between the real trajectories of vessels. The growth of these trajectories required measurements to be conducted under different voyages. The results show that the similarity measurement between the vessel trajectories is efficient and correct. Comparison of the synthesized distance with the sailing behaviors of vessels proves that results are consistent with actual situations. The experiment results demonstrate the promising application of the proposed model in studying vessel traffic and in supplying reliable data for the development of maritime ITS.

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A Measure of Similarity Between Trajectories of Vessels

Due to higher processing power to cost ratio, it is now possible to replace the manual detection methods used in the IC (Integrated Circuit) industry by Image-processing based automated methods, to detect a broken pin of an IC connected on a PCB during manufacturing, which will make the process faster, easier and cheaper. In this paper an accurate and fast automatic detection method is used where the top view camera shots of PCBs are processed using advanced methods of 2-dimensional discrete wavelet pre-processing before applying edge-detection. Comparison with conventional edge detection methods such as Sobel, Prewitt and Canny edge detection without 2-D DWT is also performed.

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Kushal Kumar

Papers

2-Dimensional Wavelet pre-processing to extract IC-Pin information for disarrangement analysis