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L. B. Freund

Bio: L. B. Freund is an academic researcher from Brown University. The author has contributed to research in topics: Dislocation & Delamination. The author has an hindex of 1, co-authored 1 publications receiving 1510 citations.

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02 Feb 2004
TL;DR: The role of stress in mass transport is discussed in this article, where the authors consider anisotropic and patterned films, buckling, bulging, peeling and fracture.
Abstract: 1. Introduction and overview 2. Film stress and substrate curvature 3. Stress in anisotropic and patterned films 4. Delamination and fracture 5. Film buckling, bulging and peeling 6. Dislocation formation in epitaxial systems 7. Dislocation interactions and strain relaxation 8. Equilibrium and stability of surfaces 9. The role of stress in mass transport.

1,562 citations


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Journal ArticleDOI
TL;DR: In this article, an introduction to TBCs is presented, where complex, multi-layer evolving systems touch on several known phenomena in materials science and engineering, and the major challenges to improved coating development and the rich opportunities for materials research are discussed.
Abstract: Gas-turbine engines used in transportation, energy, and defense sectors rely on high-temperature thermal-barrier coatings (TBCs) for improved efficiencies and power. The promise of still higher efficiencies and other benefits is driving TBCs research and development worldwide. An introduction to TBCs—complex, multi-layer evolving systems—is presented, where these fascinating systems touch on several known phenomena in materials science and engineering. Critical elements identified as being important to the development of future TBCs form the basis for the five articles in this issue of MRS Bulletin. These articles are introduced, together with a discussion of the major challenges to improved coating development and the rich opportunities for materials research they provide.

1,034 citations

Journal ArticleDOI
TL;DR: In this paper, the effect of biaxial strain on the properties of epitaxial ferroelectric thin films and superlattices is discussed. But the results for single-layer thin films are not discussed.
Abstract: Predictions and measurements of the effect of biaxial strain on the properties of epitaxial ferroelectric thin films and superlattices are reviewed. Results for single-layer ferroelectric films of biaxially strained SrTiO3, BaTiO3, and PbTiO3 as well as PbTiO3/SrTiO3 and BaTiO3/SrTiO3 superlattices are described. Theoretical ap- proaches, including first principles, thermodynamic analysis, and phase-field models, are applied to these biaxially strained materials, the assumptions and limitations of each technique are explained, and the predictions are compared. Measurements of the effect of biax- ial strain on the paraelectric-to-ferroelectric transition temperature (TC) are shown, demonstrating the ability of percent-level strains to shift TC by hundreds of degrees in agreement with the predic- tions that predated such experiments. Along the way, important ex- perimental techniques for characterizing the properties of strained ferroelectric thin films and superlattices, as well as appropriate sub- strates on which to grow them, are mentioned.

957 citations

Journal ArticleDOI
TL;DR: In this paper, an overview of the principal deformation mechanisms of ultra-strength materials is presented, and the fundamental defect processes that initiate and sustain plastic flow and fracture are described, as well as the mechanics and physics of both displacive and diffusive mechanisms.

701 citations

Journal ArticleDOI
TL;DR: In this paper, a modified form of the Stoney equation, well known for elastic isotropic substrates, is derived for Si(001) and Si(111) wafers, using the elastic stiffness constants of silicon, cij, instead of the orientation averaged values E and ν, which do not have a meaning for elastically anisotropic single crystal materials.

563 citations

Journal ArticleDOI
TL;DR: In this paper, in situ measurements of stress evolution in a silicon thin-film electrode during electrochemical lithiation and delithiation by using the multi-beam optical sensor (MOS) technique are reported.

559 citations