L
L. De Chiffre
Researcher at Technical University of Denmark
Publications - 84
Citations - 4533
L. De Chiffre is an academic researcher from Technical University of Denmark. The author has contributed to research in topics: Metrology & Surface finish. The author has an hindex of 31, co-authored 82 publications receiving 4040 citations. Previous affiliations of L. De Chiffre include University of Brescia.
Papers
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Journal ArticleDOI
Computed tomography for dimensional metrology
Jean-Pierre Kruth,Markus Bartscher,Simone Carmignato,Robert Schmitt,L. De Chiffre,Albert Weckenmann +5 more
TL;DR: In this paper, a survey of the use of X-ray computed tomography (CT) for dimensional quality control purposes is presented, focusing on issues such as accuracy, traceability to the unit of length (the meter), and measurement uncertainty.
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Industrial applications of computed tomography
TL;DR: The number of industrial applications of computed tomography (CT) is large and rapidly increasing as discussed by the authors, and a survey of state of the art and upcoming CT technologies, covering types of CT systems, scanning capabilities, and technological advances is given.
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Metrology of freeform shaped parts
TL;DR: In this article, the authors present the state of the art in the metrology of freeform shapes with focus on the freeform capabilities of the most important measuring techniques and on related metrological issues.
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Dimensional micro and nano metrology
TL;DR: The need for dimensional micro and nano metrology is evident, and as critical dimensions are scaled down and geometrical complexity of objects is increased, the available technologies appear not sufficient as mentioned in this paper.
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Surfaces in Precision Engineering, Microengineering and Nanotechnology
TL;DR: In this article, the role of surfaces at the micrometric and nanometric length scales is discussed and applications, functional behaviour, and manufacturing issues are reviewed with respect to state-of-the-art and emerging products fabricated using high precision technologies.