We demonstrate a multi-spectral polarization sensitive mid-infrared dots-in-a-well (DWELL) photodetector utilizing surface-plasmonic resonant elements, with tailorable frequency response and polarization selectivity. The resonant responsivity of the surface-plasmon detector shows an enhancement of up to 5 times that of an unpatterned control detector. As the plasmonic resonator involves only surface patterning of the top metal contact, this method is independent of light-absorbing material and can easily be integrated with current focal plane array processing for imaging applications.

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A multi-spectral and polarization-selective surface-plasmon resonant mid-infrared detector

We demonstrate a multispectral polarization sensitive midinfrared dots-in-a-well photodetector utilizing surface-plasmonic resonant elements, with tailorable frequency response and polarization selectivity. The resonant responsivity of the surface-plasmon detector shows an enhancement of up to five times that of an unpatterned control detector. As the plasmonic resonator involves only surface patterning of the top metal contact, this method is independent of light-absorbing material and can easily be integrated with current focal plane array processing for imaging applications.

/pdf/a-multispectral-and-polarization-selective-surface-plasmon-3jslxriuqm.pdf

A multispectral and polarization-selective surface-plasmon resonant midinfrared detector

In this paper, the realization and the characterization of a resonant cavity enhanced (RCE) photodetector, completely silicon compatible and working at 1.55μm, are reported. The detector is a RCE structure incorporating a Schottky diode and its working principle is based on the internal photoemission effect. Taking advantage of a Cu∕Si Schottky diode fed on a high reflectivity Bragg mirror, an improvement in responsivity at 1.55μm is experimentally demonstrated.

Silicon resonant cavity enhanced photodetector based on the internal photoemission effect at 1.55μm: Fabrication and characterization

The authors demonstrate the design, growth, fabrication, and characterization of resonant cavity enhanced InAs∕In0.15Ga0.85As dots-in-a-well (RC-DWELL) quantum dot infrared photodetector (QDIP) and compare it with a standard DWELL detector. They measured peak photoresponse at the resonant wavelength of 9.5μm for the RC-DWELL photodetector. The peak responsivity was measured to be 0.76A∕W at 1.4V and the peak detectivity was 1.4×1010cmHz1∕2∕W at 0.5V at a temperature of 77K. The photocurrent density increased in comparison with the standard DWELL structure with the same active region by a factor of 6 at Vb=2.1V and 80K. A factor of 6 increase in responsivity and factor of 3 increase in detectivity at 1.2V and 77K were also observed in the resonant cavity enhanced DWELL sample. The quantum efficiencies for the RC-DWELL sample were calculated to be ∼10% at 9.5μm and 1.25% at 10μm for the standard DWELL sample. They conclude that the RC-DWELL is a promising improvement for QDIP-based infrared detection applic...

Resonant cavity enhanced InAs∕In0.15Ga0.85As dots-in-a-well quantum dot infrared photodetector

Starting from the growth of high-quality 1.3μmGaInNAs∕GaAs quantum well (QW), the QW emission wavelength has been extended up to 1.55μm by a combination of lowering growth rate, using GaNAs barriers and incorporating some amount of Sb. The photoluminescence properties of 1.5μm range GaInNAsSb∕GaNAs QWs are quite comparable to the 1.3μm QWs, revealing positive effect of Sb on improving the optical quality of the QWs. A 1.59μm lasing of a GaInNAsSb∕GaNAs single-QW laser diode is obtained under continuous current injection at room temperature. The threshold current density is 2.6kA∕cm2 with as-cleaved facet mirrors.

GaAs-based room-temperature continuous-wave 1.59 {mu}m GaInNAsSb single-quantum-well laser diode grown by molecular-beam epitaxy

We report the design, growth, fabrication, and characterization of a GaAs-based resonant-cavity-enhanced (RCE) GaInNAs photodetector operating at 1.55μm. The structure of the device was designed using a transfer-matrix method (TMM). By optimizing the molecular-beam epitaxy growth conditions, six GaInNAs quantum wells were used as the absorption layers. Twenty-five (25)- and 9-pair GaAs∕AlAs-distributed Bragg reflectors were grown as the bottom and top mirrors. At 1.55μm, a quantum efficiency of 33% with a full width at half maximum of 10nm was obtained. The dark current density was 3×10−7A∕cm2 at a bias of 0V and 4.3×10−5A∕cm2 at a reverse bias of 5V. The primary time response measurement shows that the device has a rise time of less than 800ps.

1.55 mu m GaInNAs resonant-cavity-enhanced photodetector grown on GaAs

A 1.55 mu m low-temperature-grown GaAs (LT-GaAs) photodetector with a resonant-cavityenhanced structure was designed and fabricated. A LT-GaAs layer grown at 200 degrees C was used as the absorption layer. Twenty- and fifteen-pair GaAs/AlAs-distributed Bragg reflectors were grown as the bottom and top mirrors. A responsivity of 7.1 mA/W with a full width at half maximum of 4 nm was obtained at 1.61 mu m. The dark current densities are 1.28x10(-7) A/cm(2) at the bias of 0 V and 3.5x10(-5) A/cm(2) at the reverse bias of 4.0 V. The transient response measurement showed that the photocarrier lifetime in LT-GaAs is 220 fs. (c) 2006 American Institute of Physics.

High-performance 1.55 mu m low-temperature-grown GaAs resonant-cavity-enhanced photodetector

Towards High-temperature Electron-hole Condensate Phases in Monolayer Tetrels Metal Halides: Ultra-long Excitonic Lifetimes, Phase Diagram and Exciton Dynamics

L. H. Peng

Papers

1.55 mu m GaInNAs resonant-cavity-enhanced photodetector grown on GaAs

High-performance 1.55 mu m low-temperature-grown GaAs resonant-cavity-enhanced photodetector

Towards High-temperature Electron-hole Condensate Phases in Monolayer Tetrels Metal Halides: Ultra-long Excitonic Lifetimes, Phase Diagram and Exciton Dynamics