Liam Blunt

Bio: Liam Blunt is an academic researcher from University of Huddersfield. The author has contributed to research in topics: Surface metrology & Surface finish. The author has an hindex of 34, co-authored 255 publications receiving 4580 citations. Previous affiliations of Liam Blunt include Coventry Health Care & Coventry University.

Surface texture metrology for metal additive manufacturing: a review

Abstract: A comprehensive analysis of literature pertaining to surface texture metrology for metal additive manufacturing has been performed. This review paper structures the results of this analysis into sections that address specific areas of interest: industrial domain; additive manufacturing processes and materials; types of surface investigated; surface measurement technology and surface texture characterisation. Each section reports on how frequently specific techniques, processes or materials have been utilised and discusses how and why they are employed. Based on these results, possible optimisation of methods and reporting is suggested and the areas that may have significant potential for future research are highlighted.

Paradigm shifts in surface metrology. Part II. The current shift

Abstract: This is the second part of the paper ‘Paradigm shifts in surface metrology’. In part I, the three historical paradigm shifts in surface metrology were brought together, and the subsequent evolution resulting from the shifts discussed. The historical philosophy highlighted the fact that the paradigm shifts must be robust and flexible, meaning that surface metrology must allow for full control of surface manufacture and provide an understanding of the surface functional performance. Part II presents the current paradigm shift as a ‘stepping stone’, building on the above historical context. Aspects of surface geometry will also have to cater for surfaces derived from disruptive application, i.e. structured and freeform surfaces are identified candidates. The current shift is presented in three aspects: from profile to areal characterization; from stochastic to structured surfaces; and from simple geometries to complex freeform geometries, all spanning the millimetre to sub-nanometre scales. In this paradigm shift, the scale of surface texture is beginning to approach some of the geometrical features in micro/nano electro-mechanical systems devices and is becoming one of the most important functionality indicators. Part II will contextualize the current shifts in the discipline of surface metrology, and cement surface metrology in place in the ultra precision and nanotechnology age.

Advanced Techniques for Assessment Surface Topography: Development of a Basis for 3D Surface Texture Standards "Surfstand"

Abstract: Osa calibration sample for osa osa publishing. advanced techniques for assessment surface topography. coherence correlation interferometry in surface topography. creating topography from a dwg link. forensic topography and surface metrology nist. model for the prediction of 3d surface topography in 5. calibration sample for arbitrary metrological. surface textural analysis using acousto optic emission. basic ponents amp elements of surface topography. advanced techniques for assessment surface topography. advanced techniques for assessment surface topography. a study of filtering techniques for areal surface. variations in the trunnion surface topography between. advanced techniques for assessment surface topography. advanced techniques for assessment surface topography by. surface topography of chromium coatings after pneumatic. advanced techniques for assessment surface topography. advanced techniques for assessment surface topography. coherence correlation interferometry in surface topography. advanced techniques for assessment surface topography. advanced techniques for assessment surface topography. quantitative characterisation of surface finishes on. advanced techniques for assessment surface topography. advanced techniques for assessment surface topography. advances in science and technology research journal. advanced techniques for assessment surface topography. advanced techniques for assessment surface topography. introduction to surface topography springerlink. surface roughness measurements. on in vivo skin topography metrology and replication. development of ballistics identification from image. assessing the child with scoliosis the role of surface. advanced techniques for assessment surface topography sanet. advanced techniques for assessment surface topography. advanced techniques for assessment surface topography. advanced techniques for assessment surface topography. advanced techniques for assessment surface topography by. variations in the trunnion surface topography between. the effect of reference plane on values of areal surface. quantitative characterisation of surface finishes on. surface topography assessment techniques based on an in. digital filtering of surface topography part i. surface characterization techniques an overview. numerical parameters for characterisation of topography. advanced techniques for assessment surface topography. blunt l jiang x advanced techniques for assessment

Three-Dimensional Surface Topography

Abstract: Part I: Development of Surface Characterization 1. History of the subject 2. Development of surface parameters 3. Progress in filtering 4. Instrumentation 5. Development of integrated 3-D parameter set 6. Future Developments 7. Contents of the proposed standard. Part II: Instruments and Measurement Techniques of Three-dimensional Surface Topography 1. Introduction 2. Differences in measurement and analysis methods for 3-D and 3-D surface topography 3. Stylus instruments 4. Optical instruments 5. Non-optical scanning microscopy 6. Characteristics of the different types of available instruments 7. Conclusions. Part III: Filtering Technology for Three-Dimensional Surface Topography Analysis. 1. Nomenclature 2. Introduction 3. History of surface data filters 4. 3-D general filtering techniques 5. Robust filters 6. The problems of frequency domain filters 7. Wavelet digital filters 8. Motif filters 9. Conclusion. Part IV: Visualization Techniques and Parameters for Characterizing Three-Dimensional Surface Topography 1. Nomenclature 2. Introduction 3. Surface topography in three dimensions 4.Visualization techniques 5. Specification of parameters 6. A primary parameter set amplitude, height distribution, spatial, hybrid and functional. Part V: Applications of Three-Dimensional Surface Metrology 1. Introduction 2. Measurement of a gear surface with a stylus lead screw-driven instrument 3. Measurement of an engine bore surface with a stylus linear motor-driven instrument 4. Measurement of thick-film superconductors with a focus detection instrument 5. Measurement of human skin with a focus detection instrument 6. Measurement of the topography of hip prostheses using phase shifting interferometer 7. Measurement of a polished brass surface using a scanning tunnelling microscope 8. Characterization of surface topography of indentations 9. Conclusions. Part VI: Engineered Surfaces - A Philosophy of Manufacture 1. A philosophy of manufacture 2. The complex interrelationships in producing an engineered surface 3. Surface topographical features and their effect on the functional performance of surfaces 4. Surface mechanical features that can effect the functional performance of surfaces (surface integrity) 5. Subsurface features that can effect the functional performance of surfaces 6. Some examples of engineered surfaces 7. Future approach to the engineered surface 8. An example of a comprehensive testing procedure 9. FE simulations 10. Final comments.

Digital wavefront measuring interferometer for testing optical surfaces and lenses

Abstract: A self-scanned 1024 element photodiode array and minicomputer are used to measure the phase (wavefront) in the interference pattern of an interferometer to lambda/100. The photodiode array samples intensities over a 32 x 32 matrix in the interference pattern as the length of the reference arm is varied piezoelectrically. Using these data the minicomputer synchronously detects the phase at each of the 1024 points by a Fourier series method and displays the wavefront in contour and perspective plot on a storage oscilloscope in less than 1 min (Bruning et al. Paper WE16, OSA Annual Meeting, Oct. 1972). The array of intensities is sampled and averaged many times in a random fashion so that the effects of air turbulence, vibrations, and thermal drifts are minimized. Very significant is the fact that wavefront errors in the interferometer are easily determined and may be automatically subtracted from current or subsequent wavefrots. Various programs supporting the measurement system include software for determining the aperture boundary, sum and difference of wavefronts, removal or insertion of tilt and focus errors, and routines for spatial manipulation of wavefronts. FFT programs transform wavefront data into point spread function and modulus and phase of the optical transfer function of lenses. Display programs plot these functions in contour and perspective. The system has been designed to optimize the collection of data to give higher than usual accuracy in measuring the individual elements and final performance of assembled diffraction limited optical systems, and furthermore, the short loop time of a few minutes makes the system an attractive alternative to constraints imposed by test glasses in the optical shop.