L
Loe Feijs
Researcher at Eindhoven University of Technology
Publications - 212
Citations - 2917
Loe Feijs is an academic researcher from Eindhoven University of Technology. The author has contributed to research in topics: Formal specification & Context (language use). The author has an hindex of 25, co-authored 206 publications receiving 2467 citations. Previous affiliations of Loe Feijs include Philips.
Papers
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Book ChapterDOI
Formal Test Automation: A Simple Experiment
Axel Belinfante,Jan Feenstra,René G. de Vries,Jan Tretmans,Nicolae Goga,Loe Feijs,Sjouke Mauw,Lex Heerink +7 more
TL;DR: An open, generic environment called TorX is introduced to facilitate the derivation from multiple formal description techniques and the different test execution approaches, and the usability of batch-oriented and on-the-fly testing approaches is explored.
Proceedings ArticleDOI
Monitoring body temperature of newborn infants at neonatal intensive care units using wearable sensors
TL;DR: A design of non-invasive neonatal temperature monitoring with wearable sensors with negative temperature coefficient (NTC) resistor is proposed and demonstrated and results from the testing on neonates at NICU of Máxima Medical Center, Veldhoven show the accurate temperature monitoring by the prototype belt comparing with the standard patient monitor.
Proceedings ArticleDOI
Smart Jacket Design for Neonatal Monitoring with Wearable Sensors
TL;DR: The first version of the neonatal jacket that enables ECG measurement by textile electrodes is presented, and a new solution for skin-contact challenges that textile electrodes pose is explored.
Journal ArticleDOI
A relational approach to support software architecture analysis
TL;DR: This paper reports on the experience with a relational approach to support the analysis of existing software architectures and the theory, the tools and some of the applications developed so far.
Book ChapterDOI
Test Generation for Intelligent Networks Using Model Checking
TL;DR: This work studies the use of model checking techniques for the generation of test sequences and demonstrates the method by applying it to a specification of an Intelligent Network with two features.