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Luca Sterpone

Researcher at Polytechnic University of Turin

Publications -  236
Citations -  3523

Luca Sterpone is an academic researcher from Polytechnic University of Turin. The author has contributed to research in topics: Fault injection & Field-programmable gate array. The author has an hindex of 24, co-authored 222 publications receiving 3125 citations. Previous affiliations of Luca Sterpone include Instituto Politécnico Nacional.

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Journal ArticleDOI

Microvesicles Derived from Adult Human Bone Marrow and Tissue Specific Mesenchymal Stem Cells Shuttle Selected Pattern of miRNAs

TL;DR: It was demonstrated that MVs contained ribonucleoproteins involved in the intracellular traffic of RNA and selected pattern of miRNAs, suggesting a dynamic regulation of RNA compartmentalization in MVs.
Proceedings ArticleDOI

On the Optimal Design of Triple Modular Redundancy Logic for SRAM-based FPGAs

TL;DR: The experimental results presented in this paper demonstrate that the number and placement of voters in the TMR design can directly affect the fault tolerance, ranging from 4.03% to 0.98% the number of upsets in the routing able to cause an error in theTMR circuit.
Journal ArticleDOI

A new reliability-oriented place and route algorithm for SRAM-based FPGAs

TL;DR: A reliability-oriented place and route algorithm is presented that is able to effectively mitigate the effects of the considered faults and is demonstrated by extensive fault injection experiments showing that the capability of tolerating SEU effects in the FPGA's configuration memory increases up to 85 times with respect to a standard TMR design technique.
Journal ArticleDOI

A New Partial Reconfiguration-Based Fault-Injection System to Evaluate SEU Effects in SRAM-Based FPGAs

TL;DR: In this paper, the authors describe a system based on partial reconfiguration for running fault-injection experiments within the configuration memory of SRAM-based FPGAs, which uses the internal configuration capabilities that modern FPGA offer in order to inject SEU within configuration memory.
Journal ArticleDOI

Analysis of the robustness of the TMR architecture in SRAM-based FPGAs

TL;DR: In this article, the authors present an analysis of the SEU effects in circuits hardened according to Triple Module Redundancy to investigate the possibilities of successfully applying TMR to designs mapped on commercial-off-the-shelf SRAM-based FPGAs, which are not radiation hardened.