M
M. El-Hagary
Researcher at Helwan University
Publications - 81
Citations - 1377
M. El-Hagary is an academic researcher from Helwan University. The author has contributed to research in topics: Thin film & Band gap. The author has an hindex of 19, co-authored 77 publications receiving 1004 citations. Previous affiliations of M. El-Hagary include Qassim University & Sohag University.
Papers
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Journal ArticleDOI
Composition, annealing and thickness dependence of structural and optical studies on Zn1−xMnxS nanocrystalline semiconductor thin films
M. El-Hagary,M. El-Hagary,M. Emam-Ismail,M. Emam-Ismail,Essam R. Shaaban,A. Al-Rashidi,S. S. Al-Thoyaib +6 more
TL;DR: In this article, a structural investigation was carried out by using X-ray diffraction measurements and energy dispersive Xray analysis, which showed that the annealing temperature and film thickness modifies the optical constants of Zn1−xMnxS thin films.
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The particle size-dependent optical band gap and magnetic properties of Fe-doped CeO2 nanoparticles
TL;DR: In this paper, the size of nanoparticles was found to decrease from 20nm to 14nm with increasing Fe concentration, which is confirmed by TEM micrographs and the optical absorption spectra of the nanoparticles showed the blue-shift of the wavelength of absorption maximum from 550.2nm to 336.4nm.
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Structural, linear and nonlinear optical properties of co-doped ZnO thin films
Essam R. Shaaban,M. El-Hagary,El Sayed Moustafa,H. Shokry Hassan,Yasser Ismail,M. Emam-Ismail,Asem Shehadeh Saleh Ali +6 more
TL;DR: In this paper, the dispersion of refractive index has been analyzed in terms of the Wemple-DiDomenico (WDD) single-oscillator model for different compositions of Co-doped zinc oxide.
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Effect of γ-irradiation exposure on optical properties of chalcogenide glasses Se70S30−xSbx thin films
M. El-Hagary,M. El-Hagary,M. Emam-Ismail,M. Emam-Ismail,Essam R. Shaaban,Atef El-Taher,Atef El-Taher +6 more
TL;DR: In this paper, the effect of the γ-irradiation exposure by 100-500kGy doses on the optical properties and single oscillator parameters for chalcogenide glasses Se 70 S 30− x Sb x ( x = 0, 12, 18 and 30 ǫ at%) thin films were modeled from transmission spectra data measured by spectrophotometry.
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Structural, optical and dispersion energy parameters of nickel oxide nanocrystalline thin films prepared by electron beam deposition technique
TL;DR: In this article, the structure and optical properties of non-annealed nickel oxides (NiO) nanocrystalline semiconductor thin films synthesized by electron beam deposition technique are reported.