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M

M. Mumtaz Qazilbash

Researcher at College of William & Mary

Publications -  67
Citations -  5032

M. Mumtaz Qazilbash is an academic researcher from College of William & Mary. The author has contributed to research in topics: Infrared & Superconductivity. The author has an hindex of 28, co-authored 62 publications receiving 4434 citations. Previous affiliations of M. Mumtaz Qazilbash include University of California, San Diego & University of Maryland, College Park.

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Mott Transition in VO2 Revealed by Infrared Spectroscopy and Nano-Imaging

TL;DR: The electronic properties of a prototypical correlated insulator vanadium dioxide in which the metallic state can be induced by increasing temperature is reported, setting the stage for investigations of charge dynamics on the nanoscale in other inhomogeneous correlated electron systems.
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Ultra-thin perfect absorber employing a tunable phase change material

TL;DR: In this paper, the authors show that perfect absorption can be achieved in a system comprising a single lossy dielectric layer of thickness much smaller than the incident wavelength on an opaque substrate by utilizing the nontrivial phase shifts at interfaces between lossy media.
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Dynamic tuning of an infrared hybrid-metamaterial resonance using vanadium dioxide

TL;DR: In this paper, a hybrid-metamaterial architecture is proposed for tuning a far-infrared resonance frequency with vanadium dioxide (VO2), a material whose optical properties can be strongly and quickly changed via external stimulus.
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Electronic correlations in the iron pnictides

TL;DR: In this paper, an infrared and optical study on single crystals of the iron pnictide superconductor LaFePO was performed, and it was shown that correlations between electrons in these materials are just as strong as in some copper oxide and ruthenate superconductors.
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Electrodynamics of the vanadium oxides VO2 and V2O3

TL;DR: The optical and infrared properties of films of vanadium dioxide and vanadium sesquioxide have been investigated via ellipsometry and near-normal incidence reflectance measurements from far infrared to ultraviolet frequencies as discussed by the authors.