M
M. Ohtani
Researcher at Tohoku University
Publications - 31
Citations - 2513
M. Ohtani is an academic researcher from Tohoku University. The author has contributed to research in topics: Thin film & Pulsed laser deposition. The author has an hindex of 11, co-authored 31 publications receiving 2442 citations. Previous affiliations of M. Ohtani include Tokyo Institute of Technology.
Papers
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Journal ArticleDOI
Repeated temperature modulation epitaxy for p-type doping and light-emitting diode based on ZnO
Atsushi Tsukazaki,Akira Ohtomo,Takeyoshi Onuma,M. Ohtani,Takayuki Makino,Masatomo Sumiya,Keita Ohtani,Shigefusa F. Chichibu,S. Fuke,Yusaburou Segawa,Hideo Ohno,Hideomi Koinuma,Masashi Kawasaki +12 more
TL;DR: In this paper, the authors used a new technique to fabricate p-type ZnO reproducibly, and showed high-quality undoped films with electron mobility exceeding that in the bulk.
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Rapid construction of a phase diagram of doped Mott insulators with a composition-spread approach
Tomoteru Fukumura,M. Ohtani,Masashi Kawasaki,Yoichi Okimoto,T. Kageyama,Takashi Koida,T. Hasegawa,Yoshinori Tokura,Hideomi Koinuma +8 more
TL;DR: In this paper, a phase diagram of doped Mott insulators is constructed using a composition spread method for fabricating a film whose doping concentration varies from 0 to 1 continuously, and the concurrent x-ray diffractometer, scanning superconducting quantum interference device microscope and infrared optical spectroscopy are employed for characterizing the film.
Journal ArticleDOI
Systematic examination of carrier polarity in composition spread ZnO thin films codoped with Ga and N
Atsushi Tsukazaki,H. Saito,K. Tamura,M. Ohtani,Hideomi Koinuma,Masatomo Sumiya,S. Fuke,Tomoteru Fukumura,Masashi Kawasaki +8 more
TL;DR: Yamamoto et al. as mentioned in this paper have grown high-crystallinity ZnO thin films on lattice-matched ScAlMgO4 substrates by pulsed-laser deposition with doping donor (Ga) and acceptor (N) simultaneously.
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Concurrent x-ray diffractometer for high throughput structural diagnosis of epitaxial thin films
M. Ohtani,Tomoteru Fukumura,Masashi Kawasaki,Kazuhiko Omote,T. Kikuchi,J. Harada,Akira Ohtomo,Mikk Lippmaa,Tsuyoshi Ohnishi,D. Komiyama,Ryota Takahashi,Yuji Matsumoto,Hideomi Koinuma +12 more
TL;DR: In this paper, a concurrent x-ray diffractometer that concurrently measures spatially resolved X-ray spectra of epitaxial thin films integrated on a substrate is developed.
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Temperature-gradient epitaxy under in situ growth mode diagnostics by scanning reflection high-energy electron diffraction
TL;DR: In this paper, a continuous wave neodymium-doped yttrium-aluminum-garnet laser heating was used to achieve a stable temperature gradient covering a 300°C range of temperatures over a distance of 11 mm.