M
M. Renovell
Publications - 13
Citations - 605
M. Renovell is an academic researcher. The author has contributed to research in topics: Automatic test pattern generation & Field-programmable gate array. The author has an hindex of 11, co-authored 13 publications receiving 602 citations.
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Journal ArticleDOI
Testing the interconnect of RAM-based FPGAs
TL;DR: The authors devise an efficient test procedure for the interconnect structure and demonstrate its applicability to commercial FPGAs.
Proceedings ArticleDOI
Test of RAM-based FPGA: methodology and application to the interconnect
TL;DR: A methodology for testing RAM-based FPGA taking into account the configurability of such flexible devices is proposed and it is demonstrated that a set of only 3 Test Configurations suffice to make 100% of the considered realistic fault set non-redundant.
Proceedings ArticleDOI
IS-FPGA : a new symmetric FPGA architecture with implicit scan
TL;DR: It is demonstrated that the implicit-scan concept allows 'over-scan' of sequential circuits resulting in highly testable circuits and is transparent for the user as well as for the FPGA mapping tools.
Proceedings ArticleDOI
SRAM-based FPGA's: testing the LUT/RAM modules
TL;DR: This paper addresses the problem of testing the LUT/RAM modules of configurable SRAM-based FPGAs using a minimum number of test configurations using the concept of non-redundant test that proposes to test in LUT mode the parts of the module not tested in RAM mode.
Journal ArticleDOI
SRAM-Based FPGAs: Testing the Embedded RAM Modules
TL;DR: This paper addresses the problem of testing the RAM mode of the LUT/RAM modules of configurable SRAM-based Field Programmable Gate Arrays (FPGAs) using a minimum number of test configurations and proposes a unique test configuration called ‘pseudo shift register’ for an m × m array of modules.