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M.S. Jagadeesh

Researcher at Indian Institute of Technology Madras

Publications -  7
Citations -  86

M.S. Jagadeesh is an academic researcher from Indian Institute of Technology Madras. The author has contributed to research in topics: Thin film & Electrical resistivity and conductivity. The author has an hindex of 5, co-authored 7 publications receiving 85 citations.

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Colour centre studies in MoO3 films

TL;DR: The growth of defects in vacuum-evaporated MoO3 films has been studied by optical absorption in the present work as discussed by the authors, where as-grown films were subjected to different kinds of treatment such as thermal annealing, UV and X-ray irradiation, and their optical absorption spectra were recorded between 300 and 1500 nm at room temperature as well as at liquid N2 temperature.
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Annealing and thickness effects on the electrical resistance of vacuum-deposited tin antimonide alloy films

TL;DR: In this article, the initial lattice distortion energy spectra of the films have been determined from the resistance-temperature data, and it is found that the resistivity values for films of different thicknesses are in good agreement with the size effect theory.
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Defect density variation with deposition rate in snsb thin films from annealing study of electrical resistance

TL;DR: In this paper, the initial lattice distortion energy spectra of SnSb thin films of the same thickness (600 A) vacuum deposited at room temperature on glass substrates at various deposition rates were heated to a maximum temperature of about 300°C and the changes in the electrical resistance with temperature were recorded.
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Band gap and intergrain barrier activation energies in Bi90Sb10 thin films

TL;DR: In this paper, electrical resistivity and Hall effect measurements have been made on vacuum evaporated Bi 90 Sb 10 alloy films of various thickness (350 A to 4500 A), in the temperature range of 77 to 510 K.
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Semiconducting behavior in antimony-doped bismuth films

TL;DR: In this article, the electric resistivity and Hall effect were studied for the vacuum evaporated and annealed ∠1 at.% Sb-doped bismuth alloy films of various thickness (350-3500 A) in the temperature range of 77-510 K.