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Matteo Sonza Reorda

Researcher at Polytechnic University of Turin

Publications -  340
Citations -  5043

Matteo Sonza Reorda is an academic researcher from Polytechnic University of Turin. The author has contributed to research in topics: Fault coverage & Automatic test pattern generation. The author has an hindex of 32, co-authored 295 publications receiving 4525 citations. Previous affiliations of Matteo Sonza Reorda include University of California, Riverside & NXP Semiconductors.

Papers
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Journal ArticleDOI

RT-level ITC'99 benchmarks and first ATPG results

TL;DR: In this article, the authors propose a suite of RT-level benchmarks that help improve research in high-level ATPG tools, such as testability evaluation of circuits and the evaluation of testability of circuits.
Proceedings ArticleDOI

On the Optimal Design of Triple Modular Redundancy Logic for SRAM-based FPGAs

TL;DR: The experimental results presented in this paper demonstrate that the number and placement of voters in the TMR design can directly affect the fault tolerance, ranging from 4.03% to 0.98% the number of upsets in the routing able to cause an error in theTMR circuit.
Journal ArticleDOI

Microprocessor Software-Based Self-Testing

TL;DR: A taxonomy for different SBST methodologies according to their test program development philosophy is proposed, and research approaches based on SBST techniques for optimizing other key aspects are summarized.
Book

Software-Implemented Hardware Fault Tolerance

TL;DR: This book presents the theory behind software-implemented hardware fault tolerance, as well as the practical aspects needed to put it to work on real examples, and identifies open issues for researchers willing to improve the already available techniques.
Journal ArticleDOI

Automatic test program generation: a case study

TL;DR: This work focuses on simulation-based design validation performed at the behavioral register-transfer level, where designers typically write assertions inside hardware description language (HDL) models and run extensive simulations to increase confidence in device correctness.