M
Maximilian Haider
Researcher at European Bioinformatics Institute
Publications - 53
Citations - 3569
Maximilian Haider is an academic researcher from European Bioinformatics Institute. The author has contributed to research in topics: Spherical aberration & Contrast transfer function. The author has an hindex of 27, co-authored 51 publications receiving 3341 citations. Previous affiliations of Maximilian Haider include Applied Materials.
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Journal ArticleDOI
Electron microscopy image enhanced
TL;DR: In this paper, the authors report a solution to this problem for a medium-voltage electron microscope which gives a stunning enhancement of image quality, which can be used to improve the resolution of the electron microscope.
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Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit
Christian Kisielowski,Bert Freitag,Maarten Bischoff,H. van Lin,Sorin Lazar,G. Knippels,Peter Tiemeijer,M Van der Stam,S. von Harrach,M Stekelenburg,Maximilian Haider,Stephan Uhlemann,Heiko Müller,Peter Hartel,Bernd Kabius,Dean J. Miller,Ivan Petrov,E. A. Olson,Todor I. Donchev,Edward A. Kenik,Andrew R. Lupini,James Bentley,Stephen J. Pennycook,Ian M. Anderson,Andrew M. Minor,Andreas K. Schmid,T Duden,Velimir Radmilovic,Quentin M. Ramasse,Masashi Watanabe,Rolf Erni,Eric A. Stach,Peter Denes,U. Dahmen +33 more
TL;DR: The instrument's new capabilities were exploited to detect a buried Σ3 {112} grain boundary and observe the dynamic arrangements of single atoms and atom pairs with sub-angstrom resolution, an important step toward meeting the challenge of determining the three-dimensional atomic-scale structure of nanomaterials.
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Towards 0.1 nm resolution with the first spherically corrected transmission electron microscope
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Transmission electron microscopy at 20 kV for imaging and spectroscopy
Ute Kaiser,Johannes Biskupek,Jannik C. Meyer,Jens Leschner,Lorenz Lechner,Harald Rose,Michael Stöger-Pollach,Andrei N. Khlobystov,Peter Hartel,Heiko Müller,Maximilian Haider,Soeren Eyhusen,Gerd Benner +12 more
TL;DR: These very first results demonstrate that low kV TEM is an exciting new tool for determination of structural and electronic properties of different types of nano-materials.
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Residual wave aberrations in the first spherical aberration corrected transmission electron microscope
TL;DR: In this article, the optical properties of a spherical aberration corrected transmission electron microscope by means of beam tilt series are demonstrated by measuring residual wave aberrations up to the fifth order.