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Ming-Dou Ker

Researcher at National Chiao Tung University

Publications -  664
Citations -  9707

Ming-Dou Ker is an academic researcher from National Chiao Tung University. The author has contributed to research in topics: Electrostatic discharge & CMOS. The author has an hindex of 44, co-authored 645 publications receiving 9042 citations. Previous affiliations of Ming-Dou Ker include Novatek & Industrial Technology Research Institute.

Papers
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Journal ArticleDOI

Overview of on-chip electrostatic discharge protection design with SCR-based devices in CMOS integrated circuits

TL;DR: An overview on the electrostatic discharge (ESD) protection circuits by using the silicon controlled rectifier (SCR)-based devices in CMOS ICs is presented and the solutions to overcome latchup issue in the SCR-based devices are discussed.
Journal ArticleDOI

Design of charge pump circuit with consideration of gate-oxide reliability in low-voltage CMOS processes

TL;DR: The new proposed circuit with consideration of gate-oxide reliability is designed with two pumping branches and is suitable for applications in low-voltage CMOS processes because of its high pumping efficiency and no overstress across the gate oxide of devices.
Patent

Silicon-on-insulator diodes and ESD protection circuits

TL;DR: In this article, a silicon-on-insulator (SOI) gated diode and non-gated junction diode are provided for electrical overstress (EOS)/electrostatic discharge (ESD) protection.
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New Curvature-Compensation Technique for CMOS Bandgap Reference With Sub-1-V Operation

TL;DR: The new proposed sub-1V curvature-compensated CMOS bandgap reference has been successfully verified in a standard 0.25 /spl mu/m CMOS process.