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Showing papers by "Moinuddin K. Qureshi published in 2011"


Proceedings ArticleDOI
03 Dec 2011
TL;DR: This paper proposes Pay-As-You-Go (PAYG), an efficient hard-error resilient architecture that allocates error correction entries in proportion to the number of hard-faults in the line, and describes a storage-efficient and low-latency organization for PAYG.
Abstract: Phase Change Memory (PCM) suffers from the problem of limited write endurance. This problem is exacerbated because of the high variability in lifetime across PCM cells, resulting in weaker cells failing much earlier than nominal cells. Ensuring long lifetimes under high variability requires that the design can correct a large number of errors for any given memory line. Unfortunately, supporting high levels of error correction for all lines incurs significantly high overhead, often exceeding 10% of overall memory capacity. Such an overhead may be too high for wide-scale adoption of PCM, given that memory market is typically very cost-sensitive. This paper reduces the storage required for error correction by making the key observation that only a few lines require high levels of hard-error correction. Therefore, prior approaches that uniformly allocated large number of error correction entries for all lines are inefficient, as most (> 90%) of these entries remain unused. We propose Pay-As-You-Go (PAYG), an efficient hard-error resilient architecture that allocates error correction entries in proportion to the number of hard-faults in the line. We describe a storage-efficient and low-latency organization for PAYG. Compared to the previously proposed ECP-6 technique, PAYG requires 3X lower storage overhead and yet provides 13% more lifetime, while incurring a latency overhead of < 0.4% for the first five years of system lifetime. We also show that PAYG is more effective than the recent FREE-p proposal.

137 citations


Book
05 Dec 2011
TL;DR: This synthesis lecture begins by listing the requirements for a next generation memory technology and briefly surveying the landscape of novel non-volatile memories, and describes architectural solutions to enable PCM for main memories.
Abstract: As conventional memory technologies such as DRAM and Flash run into scaling challenges, architects and system designers are forced to look at alternative technologies for building future computer systems. This synthesis lecture begins by listing the requirements for a next generation memory technology and briefly surveying the landscape of novel non-volatile memories. Among these, Phase Change Memory (PCM) is emerging as a leading contender, and the authors discuss the material, device, and circuit advances underlying this exciting technology. The lecture then describes architectural solutions to enable PCM for main memories. Finally, the authors explore the impact of such byte-addressable non-volatile memories on future storage and system designs. Table of Contents: Next Generation Memory Technologies / Architecting PCM for Main Memories / Tolerating Slow Writes in PCM / Wear Leveling for Durability / Wear Leveling Under Adversarial Settings / Error Resilience in Phase Change Memories / Storage and System Design With Emerging Non-Volatile Memories

128 citations


Proceedings ArticleDOI
12 Feb 2011
TL;DR: A practical wear-leveling framework that can provide years of lifetime under attacks while still incurring negligible (<1%) write overhead for typical applications is proposed.
Abstract: Phase Change Memory (PCM) may become a viable alternative for the design of main memory systems in the next few years. However PCM suffers from limited write endurance. Therefore future adoption of PCM as a technology for main memory will depend on the availability of practical solutions for wear leveling that avoids uneven usage especially in the presence of potentially malicious users. First generation wear leveling algorithms were designed for typical workloads and have significantly reduced lifetime under malicious access patterns that try to write to the same line continuously. Secure wear leveling algorithms were recently proposed. They can handle such malicious attacks, but require that wear leveling is done at a rate that is orders of magnitude higher than what is sufficient for typical applications, thereby incurring significantly high write overhead, potentially impairing overall performance system. This paper proposes a practical wear-leveling framework that can provide years of lifetime under attacks while still incurring negligible (<1%) write overhead for typical applications. It uses a simple and novel Online Attack Detector circuit to adapt the rate of wear leveling depending on the properties of the memory reference stream, thereby obtaining the best of both worlds — low overhead for typical applications and years of lifetime under attacks. The proposed attack detector requires a storage overhead of 68 bytes, is effective at estimating the severity of attacks, is applicable to a wide variety of wear leveling algorithms, and reduces the write overhead of several recently proposed wear leveling algorithms by 16x–128x. The paradigm of online attack detection enables other preventive actions as well.

99 citations


Patent
01 Jun 2011
TL;DR: Memory cell presetting as discussed by the authors is a method for using a computer system to identify a region in a memory, which includes a plurality of memory cells characterized by a write performance characteristic that has a first expected value when a write operation changes a current state of the memory cells to a desired state.
Abstract: Memory cell presetting for improved performance including a method for using a computer system to identify a region in a memory. The region includes a plurality of memory cells characterized by a write performance characteristic that has a first expected value when a write operation changes a current state of the memory cells to a desired state of the memory cells and a second expected value when the write operation changes a specified state of the memory cells to the desired state of the memory cells. The second expected value is closer than the first expected value to a desired value of the write performance characteristic. The plurality of memory cells in the region are set to the specified state, and the data is written into the plurality of memory cells responsive to the setting.

25 citations