High-resolution elastic strain measurement from electron backscatter diffraction patterns: New levels of sensitivity

Overview on micro- and nanomechanical testing: New insights in interface plasticity and fracture at small length scales

The far-field high-energy diffraction microscopy technique is presented in the context of high-energy synchrotron x-ray diffraction. For each grain in an illuminated polycrystalline volume, the volume-averaged lattice orientations, lattice strain tensors, and centre-of-mass (COM) coordinates may be determined to a high degree of precision: better than 0.05°, 1 × 10−4, and 0.1 pixel, respectively. Because the full lattice strain tensors are available, corresponding mean stress tensors may be calculated unambiguously using single-crystal elastic moduli. A novel formulation for orientation indexing and cell refinement is introduced and demonstrated using two examples: first, sequential indexing and lattice refinement of a single-crystal ruby standard with known COM coordinates; and second, indexing and refinement of simulated diffraction data from an aggregate of 819 individual grains using several sample rotation ranges and including the influence of experimental uncertainties. The speed of acquisition and ...

Far-field high-energy diffraction microscopy: a tool for intergranular orientation and strain analysis

Combinatorial approaches as effective tools in the study of phase diagrams and composition-structure-property relationships

The availability of synchrotron radiation (SR) to the scientific community has literally revolutionized the way X-ray science is done in many disciplines, including low temperature geochemistry and environmental science. The key reason is that SR provides continuum vacuum ultraviolet (VUV) and X-ray radiation five to ten orders of magnitude brighter than that from standard sealed or rotating anode X-ray tubes (Winick 1987; Altarelli et al. 1998). Although SR was first observed indirectly by John Blewitt in 1945 (Blewitt 1946) and directly by Floyd Haber in 1946 at the General Electric 100-MeV Betatron in Schenectady, NY (see Elder et al. 1947; Baldwin 1975), it took 10 to 15 years before the first systematic applications of SR, which involved spectroscopic studies of the VUV absorption of selected elements (Tomboulian and Hartman 1956) using the 300-MeV synchrotron at Cornell University and of rare gases (Madden and Codling 1963) using the National Bureau of Standards SURF I synchrotron. As of September 2002, there are about 75 storage ring-based SR sources in operation, in construction, funded, or in advanced planning in 23 countries, with 10 fully dedicated SR storage ring facilities in the U.S.. A listing of these sources can be obtained at the following web site: http://www-ssrl.slac.stanford.edu/sr_sources.html .

The first SR experiments relevant to low temperature geochemistry and environmental science, although not performed on earth or environmental materials, were X-ray absorption fine structure (XAFS) spectroscopy measurements on amorphous and crystalline germanium oxide conducted on the SPEAR storage ring at the Stanford Synchrotron Radiation Project in 1971 by Dale Sayers, Farrel Lytle, and Edward Stern (Sayers et al. 1971). Prior to the availability of SR in the hard X-ray energy range (> 5 keV), XAFS spectroscopy measurements were impractical because of the high X-ray flux required and the need for a continuously tunable …

An Overview of Synchrotron Radiation Applications to Low Temperature Geochemistry and Environmental Science

The availability of high brilliance third generation synchrotron sources together with progress in achromatic focusing optics allows us to add submicron spatial resolution to the conventional century-old x-ray diffraction technique. The new capabilities include the possibility to map in situ, grain orientations, crystalline phase distribution, and full strain/stress tensors at a very local level, by combining white and monochromatic x-ray microbeam diffraction. This is particularly relevant for high technology industry where the understanding of material properties at a microstructural level becomes increasingly important. After describing the latest advances in the submicron x-ray diffraction techniques at the Advanced Light Source, we will give some examples of its application in material science for the measurement of strain/stress in metallic thin films and interconnects. Its use in the field of environmental science will also be discussed.

/pdf/submicron-x-ray-diffraction-and-its-applications-to-problems-49ydobwr87.pdf

N. Meier Chang

Papers

Submicron X-ray diffraction and its applications to problems in materials and environmental science.