N
Nandigana K. Krishna Mohan
Researcher at Indian Institute of Technology Madras
Publications - 31
Citations - 491
Nandigana K. Krishna Mohan is an academic researcher from Indian Institute of Technology Madras. The author has contributed to research in topics: Speckle pattern & Interferometry. The author has an hindex of 12, co-authored 31 publications receiving 449 citations. Previous affiliations of Nandigana K. Krishna Mohan include Indian Institutes of Technology.
Papers
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Use of spatial phase shifting technique in digital speckle pattern interferometry (DSPI) and digital shearography (DS).
TL;DR: In this article, optical configurations for DSPI and DS with a double aperture mask in front of the imaging lens for spatial phase shifting are proposed for the measurement of out-of-plane displacement and its first order derivative (slope) respectively.
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Recent developments in digital speckle pattern interferometry
TL;DR: This poster presents a poster presenting a probabilistic procedure to constrain the response of the immune system to chemotherapy-like injuries in mice.
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Measurement of discontinuous surfaces using multiple-wavelength interferometry
TL;DR: In this paper, a three-wavelength interferometric technique is used with a phase-shifting phase evaluation procedure, which gives wrapped phase at any pixel corresponding to these wavelengths.
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Simultaneous measurement of out-of-plane displacement and slope using a multiaperture DSPI system and fast Fourier transform.
TL;DR: The simultaneous quantitative measurement of out-of-plane displacement and slope using the fast Fourier transform method with a single three-aperture digital speckle pattern interferometry (DSPI) arrangement is demonstrated.
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A dual-function ESPI system for the measurement of out-of-plane displacement and slope
TL;DR: In this paper, a dual-function ESPI system is developed for the measurement of out-of-plane displacement and its slope change and a difference-ofphase method with a five-step algorithm is used for speckle fringe analysis.