Natasa Miskov-Zivanov

TL;DR: In this paper, a symbolic framework based on BDDs and ADDs is proposed to enable analysis of combinational circuit reliability from different aspects: output susceptibility to error, influence of individual gates on individual outputs and overall circuit reliability, and dependence of circuit reliability on glitch duration, amplitude, and input patterns.

TL;DR: How output error probabilities change with increasing number of simultaneous faults is shown and the results obtained show that output error probability resulting from multiple-event transient or multiple-bit upsets can vary across different outputs and different circuits by several orders of magnitude.

TL;DR: A framework that uses BDDs and ADDs and enables the analysis of combinational circuit reliability from different aspects, e.g., output susceptibility to error, influence of individual gates on individual outputs and overall circuit reliability, and the dependence of circuit reliability on glitch duration, amplitude, and input patterns is presented.

TL;DR: There is a critical time after TCR stimulation during which heterogeneity in the differentiating population of cells leads to increased plasticity of cell fate, and this work suggests that differential timing of TCR signaling events plays an important role in determining T cell fate.

TL;DR: Two approaches to evaluating the susceptibility of sequential circuits to soft errors are presented, one of which uses the Markov chain theory but can only provide steady-state behavior information, and the other uses symbolic modeling based on binary decision diagrams/algebraic decision diagrams and circuit unrolling.