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Nathan S. Lewis
Researcher at California Institute of Technology
Publications - 730
Citations - 72550
Nathan S. Lewis is an academic researcher from California Institute of Technology. The author has contributed to research in topics: Semiconductor & Silicon. The author has an hindex of 112, co-authored 720 publications receiving 64808 citations. Previous affiliations of Nathan S. Lewis include Lawrence Berkeley National Laboratory & Massachusetts Institute of Technology.
Papers
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Comparison of the Performance of Different Discriminant Algorithms in Analyte Discrimination Tasks Using an Array of Carbon Black−Polymer Composite Vapor Detectors
TL;DR: An array of 20 compositionally different carbon black--polymer composite chemiresistor vapor detectors was challenged under laboratory conditions to discriminate between a pair of extremely similar pure analytes (H2O and D2O), compositionally similar mixtures of pairs of compounds, and low concentrations of vapors of similar chemicals.
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Photoelectrochemical behavior of planar and microwire-array Si | GaP electrodes
Nicholas C. Strandwitz,Daniel B. Turner-Evans,Adele C. Tamboli,Christopher T. Chen,Harry A. Atwater,Nathan S. Lewis +5 more
TL;DR: In this article, the photoanodic performance of heteroepitaxially grown gallium phosphide on planar and microwire-array Si substrates was investigated, and the results provided guidance for further studies of 3D multi-junction photoelectrochemical cells.
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Geophysical constraints on the reliability of solar and wind power worldwide.
Dan Tong,David J. Farnham,Lei Duan,Qiang Zhang,Nathan S. Lewis,Nathan S. Lewis,Ken Caldeira,Steven J. Davis +7 more
TL;DR: In this article, the authors analyzed the ability of solar and wind resources to meet electricity demand in 42 countries, varying the hypothetical scale and mix of renewable generation as well as energy storage capacity.
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Microwave near-field imaging of two-dimensional semiconductors.
Samuel Berweger,Joel C. Weber,Jimmy John,Jesus M. Velazquez,Adam P. Pieterick,Norman A. Sanford,Albert V. Davydov,Bruce S. Brunschwig,Nathan S. Lewis,Thomas M. Wallis,Pavel Kabos +10 more
TL;DR: Scanning microwave microscopy imaging of single layers of MoS2 and n- and p-doped WSe2 is performed to underscore the capability of SMM for the study of 2D materials to image, identify, and study electronic defects.
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Comparison of analytical methods and calibration methods for correction of detector response drift in arrays of carbon black-polymer composite vapor detectors
Brian C. Sisk,Nathan S. Lewis +1 more
TL;DR: In this article, the responses of 15 carbon black-polymer composite chemiresistors have been analyzed during exposure to eight different analytes (n-hexane, tetrahydrofuran, ethanol, ethyl acetate, cyclohexane and n-heptane, n-octane and isooctane) in random order at low concentration (0.5% of the vapor pressure of analyte at room temperature) over 4 months (8000 total analyte exposures) of data collection.