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Nitin Kumar Chhabra

Researcher at Seagate Technology

Publications -  11
Citations -  56

Nitin Kumar Chhabra is an academic researcher from Seagate Technology. The author has contributed to research in topics: Power integrity & Decoupling capacitor. The author has an hindex of 4, co-authored 11 publications receiving 41 citations. Previous affiliations of Nitin Kumar Chhabra include STMicroelectronics.

Papers
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Journal ArticleDOI

Selection and placement of decoupling capacitors in high speed systems

TL;DR: In this paper, the authors focus on damping cavity mode effects in power delivery networks by the particle swarm optimization technique and find the optimal capacitors and their locations on the board using the presented methodology.
Proceedings ArticleDOI

Damping the cavity-mode anti-resonances' peaks on a power plane by swarm intelligence algorithms

TL;DR: To maintain power integrity in a high speed system, an effective methodology for suppressing the cavity-mode anti-resonances' peaks is presented and optimal values and locations of decoupling capacitors are obtained.
Proceedings ArticleDOI

Maintaining Power Integrity by damping the cavity-mode anti-resonances' peaks on a power plane by Particle Swarm Optimization

TL;DR: To maintain Power Integrity in a high speed system, an effective methodology for suppressing the cavity-mode anti-resonances peaks is presented and optimum values and the optimal positions of the decoupling capacitors are found using Particle Swarm Optimization.
Proceedings ArticleDOI

Mitigating the impact of sinusoidal jitter and duty cycle distortion on random jitter estimation by Tailfit algorithm

TL;DR: The proposed methodology is validated by inducing known jitter sources in real channel simulator of ADS from Agilent and involves calculation of mathematical correction factor, which is derived and used to calculate the precise value of random jitter.
Proceedings ArticleDOI

A novel EBG structure with super-wideband suppression of simultaneous switching noise in high speed circuits

TL;DR: In this paper, a novel uniplanar electromagnetic band-gap structure to maintain power integrity by suppressing simultaneous switching noise (SSN) is presented, which can be used on board, package or at die level.