N
Nodari Sitchinava
Researcher at University of Hawaii at Manoa
Publications - 45
Citations - 1046
Nodari Sitchinava is an academic researcher from University of Hawaii at Manoa. The author has contributed to research in topics: Sorting & Shared memory. The author has an hindex of 14, co-authored 44 publications receiving 975 citations. Previous affiliations of Nodari Sitchinava include Karlsruhe Institute of Technology & University of Hawaii.
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Sorting, Searching, and Simulation in the MapReduce Framework
TL;DR: This work designs optimal simulations of the the well-established PRAM and BSP models in MapReduce, immediately resulting in optimal solutions to the problems of computing fixed-dimensional linear programming and 2-D and 3-D convex hulls.
Book ChapterDOI
Sorting, searching, and simulation in the mapreduce framework
TL;DR: In this paper, the authors study the MapReduce framework from an algorithmic standpoint, providing a generalization of the previous algorithmic models for mapReduce, and present optimal solutions for the fundamental problems of all-prefix-sums, sorting and multi-searching.
Proceedings ArticleDOI
Fundamental parallel algorithms for private-cache chip multiprocessors
TL;DR: This paper presents two sorting algorithms, a distribution sort and a mergesort, and studies sorting lower bounds in a computational model, which is called the parallel external-memory (PEM) model, that formalizes the essential properties of the algorithms for private-cache CMPs.
Proceedings ArticleDOI
A reconfigurable shared scan-in architecture
Samitha Samaranayake,Emil Gizdarski,Nodari Sitchinava,Frederic J. Neuveux,Rohit Kapur,T.W. Williams +5 more
TL;DR: An efficient technique for test data volume reduction based on the shared scan-in (Illinois Scan) architecture and the scan chain reconfiguration (Dynamic scan) architecture is defined and the results demonstrate the efficiency of the proposed architecture for real-industrial circuits.
Proceedings ArticleDOI
Changing the scan enable during shift
Nodari Sitchinava,Emil Gizdarski,Samitha Samaranayake,Frederic J. Neuveux,Rohit Kapur,T.W. Williams +5 more
TL;DR: This paper is the first paper of its kind that treats the scan enable signal as a test data signal during the scan operation of a test pattern and shows that the extra flexibility of reconfiguring the scan chains every shift cycle reduces the number of different configurations required by RSSA while keeping test coverage the same.