O
Oliver Ambacher
Researcher at Fraunhofer Society
Publications - 862
Citations - 29006
Oliver Ambacher is an academic researcher from Fraunhofer Society. The author has contributed to research in topics: Amplifier & Monolithic microwave integrated circuit. The author has an hindex of 64, co-authored 848 publications receiving 26256 citations. Previous affiliations of Oliver Ambacher include Osram & Siemens.
Papers
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Journal ArticleDOI
Growth and Fabrication of Quasivertical Current Aperture Vertical Electron Transistor Structures
Philipp Doering,Rachid Driad,Stefano Leone,Stefan Mueller,Patrick Waltereit,Lutz Kirste,Vladimir Polyakov,Michael Mikulla,Oliver Ambacher,Oliver Ambacher +9 more
Proceedings ArticleDOI
Advanced building blocks for (Sub-)millimeter-wave applications in space, communication, and sensing using III/V mHEMT technology
Michael Schlechtweg,Axel Tessmann,Arnulf Leuther,Hermann Massler,Guiseppe Moschetti,Markus Rosch,Rainer Weber,Volker Hurm,M. Kuri,M. Zink,M. Riessle,J. Rosenzweig,Oliver Ambacher +12 more
TL;DR: In this article, a millimeter and submillimeter-wave integrated circuits (MMICs and S-MMIC) and modules developed at the Fraunhofer IAF for manifold applications in the frequency range up to 700 GHz are presented.
Journal ArticleDOI
Nanoscale Hexagonal Gallium Nitride from Single Molecule Precursors: Microstructure and Crystallite Size Dependent Photoluminescence
TL;DR: In this paper, phase-pure hexagonal gallium nitride crystallites were synthesized by using the thermally induced explosion of the molecular precursor (Et 3 N)Ga(N 3 ) 3.
Proceedings Article
Individual source vias for GaN HEMT power bars
M. Musser,F. van Raay,Peter Brückner,Wolfgang Bronner,Rudiger Quay,Michael Mikulla,Oliver Ambacher +6 more
TL;DR: In this paper, an ISV layout based on individual source vias (ISV) is introduced and investigated for GaN HEMT power bar transistors and the influence of the source inductance on the gain parameters as well as on the stability is shown.
Journal ArticleDOI
Growth model investigation for AlN/Al(Ga)InN interface growth by plasma-assisted molecular beam epitaxy for high electron mobility transistor applications
TL;DR: In this article, a detailed analysis and a deduced model of the interface growth is presented, where the Al/N ratio during AlN spacer growth is likely to influence the subsequent growth of quaternary Al(Ga)InN.