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Oliver Ambacher

Researcher at Fraunhofer Society

Publications -  862
Citations -  29006

Oliver Ambacher is an academic researcher from Fraunhofer Society. The author has contributed to research in topics: Amplifier & Monolithic microwave integrated circuit. The author has an hindex of 64, co-authored 848 publications receiving 26256 citations. Previous affiliations of Oliver Ambacher include Osram & Siemens.

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Absorption and crystallinity of poly(3-hexylthiophene)/fullerene blends in dependence on annealing temperature

TL;DR: In this paper, the influence of the annealing temperature on film crystallinity and on optical absorption was studied, and it was shown that increased crystallinity leads to an increased optical absorption.
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Spatially resolved photoluminescence of inversion domain boundaries in GaN-based lateral polarity heterostructures

TL;DR: In this article, the inversion domain boundaries (IDBs) of lateral polarity heterostructures have been spectroscopically imaged at low temperature using high spatial resolution photoluminescence and it is shown that the IDBs are not only optically active, but are more than an order of magnitude brighter than the GaN bulk material.
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Triazidogallium and derivatives : new precursors to thin films and nanoparticles of gan

TL;DR: In this paper, the synthesis and properties of [Ga(N3)3]∞ (1) and the related derivatives [(Do)nGa(n3) 3] (2a-d): Do = THF, NEt3, NMe3, quinuclidine, n = 1; 2e: Do = pyridine; n = 3), Li[(CH3)Ga(1)3], [Cp(CO)2-Fe-Ga(2)3NMe2}] (4), [C
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Detailed analysis of the dielectric function for wurtzite InN and In‐rich InAlN alloys

TL;DR: A detailed analysis of the dielectric function for wurtzite InN as well as for In-rich InAIN alloys is presented in this article, covering the energy range from 0.72 up to 9.5 eV, were obtained by ellipsometric studies of an (1120) a-plane InN film and low carrier density (0001) c-plane films.
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Negative electron affinity of cesiated p-GaN(0001) surfaces

TL;DR: In this paper, the adsorption of cesium on clean n- and p-GaN(0001)-1×1 surfaces at 150 K was investigated using x-ray photoemission spectroscopy, photo-emission spectrum analysis with monochromatized He I radiation ultraviolet photoelectron spectra, and a Kelvin probe (contact potential difference, CPD).