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Patrick P. C. Lee

Researcher at The Chinese University of Hong Kong

Publications -  216
Citations -  6687

Patrick P. C. Lee is an academic researcher from The Chinese University of Hong Kong. The author has contributed to research in topics: Erasure code & Computer science. The author has an hindex of 41, co-authored 196 publications receiving 5536 citations. Previous affiliations of Patrick P. C. Lee include Dongguan University of Technology & Huazhong University of Science and Technology.

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Journal ArticleDOI

Secure Deduplication with Efficient and Reliable Convergent Key Management

TL;DR: This paper proposes Dekey, a new construction in which users do not need to manage any keys on their own but instead securely distribute the convergent key shares across multiple servers and demonstrates that Dekey incurs limited overhead in realistic environments.
Journal ArticleDOI

A Hybrid Cloud Approach for Secure Authorized Deduplication

TL;DR: This paper makes the first attempt to formally address the problem of authorized data deduplication, and shows that the proposed authorized duplicate check scheme incurs minimal overhead compared to normal operations.
Journal ArticleDOI

Secure Overlay Cloud Storage with Access Control and Assured Deletion

TL;DR: This work design and implement FADE, a secure overlay cloud storage system that achieves fine-grained, policy-based access control and file assured deletion, and associates outsourced files with file access policies, and assuredly deletes files to make them unrecoverable to anyone upon revocations of fileAccess policies.
Proceedings ArticleDOI

NCCloud: applying network coding for the storage repair in a cloud-of-clouds

TL;DR: This work proposes an implementable design for the functional minimum-storage regenerating code (F-MSR), which maintains the same data redundancy level and same storage requirement as in traditional erasure codes, but uses less repair traffic.
Proceedings ArticleDOI

SketchVisor: Robust Network Measurement for Software Packet Processing

TL;DR: SketchVisor augments sketch-based measurement in the data plane with a fast path, which is activated under high traffic load to provide high-performance local measurement with slight accuracy degradations and recovers accurate network-wide measurement results via compressive sensing.