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Paul Bazylewski

Researcher at University of Western Ontario

Publications -  35
Citations -  812

Paul Bazylewski is an academic researcher from University of Western Ontario. The author has contributed to research in topics: Graphene & Thin film. The author has an hindex of 13, co-authored 34 publications receiving 579 citations. Previous affiliations of Paul Bazylewski include University of Saskatchewan.

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A Review of Three-Dimensional Scanning Near-Field Optical Microscopy (3D-SNOM) and Its Applications in Nanoscale Light Management

TL;DR: In this article, the authors present an overview of aperture and apertureless type scanning near-field optical microscopy (SNOM) techniques that have been developed, with a focus on three-dimensional SNOM methods.
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Epoxide Speciation and Functional Group Distribution in Graphene Oxide Paper-Like Materials

TL;DR: In this paper, the electronic structure and chemical bonding of three differently prepared samples of graphene oxide paper-like sheets are studied, two are created by water filtration of fully oxidized graphene sheets, although one is later intercalated with dodecylamine.
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In situ Raman spectroscopy distinguishes between reversible and irreversible thiol modifications in L-cysteine

TL;DR: In situ Raman spectroscopy is found to effectively monitor the formation and subsequent breaking of disulphide bonds, and it is demonstrated that although TCEP is effective in breaking disul PH bonds, an excess of T CEP is required to reversibly form free thiol groups from L-cysteine.
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Appearance of Ferromagnetism in Co-Doped CeO2 Diluted Magnetic Semiconductors Prepared by Solid-State Reaction

TL;DR: In this article, the magnetic and electronic properties of Co-doped CeO2 oxides prepared by a solid-state reaction were investigated using soft X-ray absorption and emission spectroscopy.
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Probing the highly transparent and conducting SnOx/Au/SnOx structure for futuristic TCO applications

TL;DR: In this article, a SnOx/Au/SnOx transparent conductive oxide (TCO) multilayered film was fabricated with a total thickness of 75 nm using both e-beam and thermal evaporation techniques.