Optical coherence tomography (OCT) has developed rapidly since its first realisation in medicine and is currently an emerging technology in the diagnosis of skin disease. OCT is an interferometric technique that detects reflected and backscattered light from tissue and is often described as the optical analogue to ultrasound. The inherent safety of the technology allows for in vivo use of OCT in patients. The main strength of OCT is the depth resolution. In dermatology, most OCT research has turned on non-melanoma skin cancer (NMSC) and non-invasive monitoring of morphological changes in a number of skin diseases based on pattern recognition, and studies have found good agreement between OCT images and histopathological architecture. OCT has shown high accuracy in distinguishing lesions from normal skin, which is of great importance in identifying tumour borders or residual neoplastic tissue after therapy. The OCT images provide an advantageous combination of resolution and penetration depth, but specific studies of diagnostic sensitivity and specificity in dermatology are sparse. In order to improve OCT image quality and expand the potential of OCT, technical developments are necessary. It is suggested that the technology will be of particular interest to the routine follow-up of patients undergoing non-invasive therapy of malignant or premalignant keratinocyte tumours. It is speculated that the continued technological development can propel the method to a greater level of dermatological use.

https://link.springer.com/content/pdf/bfm%3A978-3-319-06419-2%2F1.pdf

Optical Coherence Tomography

A fast-Fourier-transform method of topography and interferometry is proposed. By computer processing of a noncontour type of fringe pattern, automatic discrimination is achieved between elevation and depression of the object or wave-front form, which has not been possible by the fringe-contour-generation techniques. The method has advantages over moire topography and conventional fringe-contour interferometry in both accuracy and sensitivity. Unlike fringe-scanning techniques, the method is easy to apply because it uses no moving components.

Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry

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Principles Of Optics Electromagnetic Theory Of Propagation Interference And Diffraction Of Light

A self-scanned 1024 element photodiode array and minicomputer are used to measure the phase (wavefront) in the interference pattern of an interferometer to lambda/100. The photodiode array samples intensities over a 32 x 32 matrix in the interference pattern as the length of the reference arm is varied piezoelectrically. Using these data the minicomputer synchronously detects the phase at each of the 1024 points by a Fourier series method and displays the wavefront in contour and perspective plot on a storage oscilloscope in less than 1 min (Bruning et al. Paper WE16, OSA Annual Meeting, Oct. 1972). The array of intensities is sampled and averaged many times in a random fashion so that the effects of air turbulence, vibrations, and thermal drifts are minimized. Very significant is the fact that wavefront errors in the interferometer are easily determined and may be automatically subtracted from current or subsequent wavefrots. Various programs supporting the measurement system include software for determining the aperture boundary, sum and difference of wavefronts, removal or insertion of tilt and focus errors, and routines for spatial manipulation of wavefronts. FFT programs transform wavefront data into point spread function and modulus and phase of the optical transfer function of lenses. Display programs plot these functions in contour and perspective. The system has been designed to optimize the collection of data to give higher than usual accuracy in measuring the individual elements and final performance of assembled diffraction limited optical systems, and furthermore, the short loop time of a few minutes makes the system an attractive alternative to constraints imposed by test glasses in the optical shop.

Digital wavefront measuring interferometer for testing optical surfaces and lenses

In-fibre Bragg grating (FBG) sensors are one of the most exciting developments in the field of optical fibre sensors in recent years. Compared with conventional fibre-optic sensors, FBG sensors have a number of distinguishing advantages. Significant progress has been made in applications to strain and temperature measurements. FBG sensors prove to be one of the most promising candidates for fibre-optic smart structures. This article presents a comprehensive and systematic overview of FBG sensor technology regarding many aspects including sensing principles, properties, fabrication, interrogation and multiplexing of FBG sensors. It is anticipated that FBG sensor systems will be commercialized and widely applied in practice in the near future due to the maturity of economical production of FBGs and the availability of cost effective interrogation and multiplexing techniques.

https://iopscience.iop.org/article/10.1088/0957-0233/8/4/002/pdf

In-fibre Bragg grating sensors

We describe a system for fast three-dimensional profilometry, of both optically smooth and optically rough surfaces, based on scanning white-light techniques. The system utilizes an efficient algorithm to extract and save only the region of interference, substantially reducing both the acquisition and the analysis times. Rough and discontinuous surfaces can be profiled without the phase-ambiguity problems associated with conventional phase-shifting techniques. The system measures steps to 100 μm, scans a 10-μm range in 5 s, and has a smooth surface repeatability of 0.5 nm.

High-speed noncontact profiler based on scanning white-light interferometry

We describe a scanning white-light interferometer for high-precision surface structure analysis. Interferograms for each of the image points in the field of view of the instrument are generated simultaneously by scanning the object in a direction perpendicular to the object surface, while recording detector data in digital memory. These interferograms are then transformed into the spatial frequency domain and the surface height for each point is obtained by examination of the complex phase as a function of frequency. The final step is the creation of a complete three-dimensional image constructed from the height data and corresponding image plane coordinates. The measurement repeatability is better than 0·5 nm r.m.s. for a surface height range of 100 μm.

Surface Profiling by Analysis of White-light Interferograms in the Spatial Frequency Domain

Interference microscopy plays a central role in noncontact strategies for process development and quality control, providing full 3D measurement of surface characteristics that influence the functional behavior of manufactured parts. Here I briefly review the history and principles of this important technique, then concentrate on the details of hardware, software, and applications of interference microscopy using phase-shifting and coherence scanning measurement principles. Recent advances considered here include performance improvements, vibration robustness, full color imaging, accommodation of highly sloped surfaces, correlation to contact methods, transparent film analysis, and international standardization of calibration and specification.

Principles of interference microscopy for the measurement of surface topography

I propose a systematic way to derive efficient, error-compensating algorithms for phase-shifting interferometry by integer approximation of well-known data-sampling windows. The theoretical basi of the approach is the observation that many of the common sources of phase-estimation error can be related to the frequency-domain characteristics of the sampling window. Improving these characteristics can therefore improve the overall performance of the algorithm. Analysis of a seven-frame example algorithm demonstrates an exceptionally good resistance to first- and second-order distortions in the phase shift and a much reduced sensitivity to low-frequency mechanical vibration.

Derivation of algorithms for phase-shifting interferometry using the concept of a data-sampling window

We demonstrate a simple way of increasing the data acquisition and processing speed in a scanning white-light interferometer for surface topography measurement. The method consists of undersampling interference data and processing the resultant sub-Nyquist interferograms in the frequency domain to create complete three-dimensional images. Experimental results on a 20-μm step height standard show a measurement repeatability of 10 nm.

Peter J. de Groot

Papers

High-speed noncontact profiler based on scanning white-light interferometry

Surface Profiling by Analysis of White-light Interferograms in the Spatial Frequency Domain

Principles of interference microscopy for the measurement of surface topography

Derivation of algorithms for phase-shifting interferometry using the concept of a data-sampling window

Three-dimensional imaging by sub-Nyquist sampling of white-light interferograms