Peter John Bryanston-Cross

Bio: Peter John Bryanston-Cross is an academic researcher from University of Warwick. The author has contributed to research in topics: Particle image velocimetry & Holography. The author has an hindex of 16, co-authored 93 publications receiving 1275 citations. Previous affiliations of Peter John Bryanston-Cross include Changchun University of Science and Technology.

A Review of data fusion models and architectures: towards engineering guidelines

Abstract: This paper reviews the potential benefits that can be obtained by the implementation of data fusion in a multi-sensor environment. A thorough review of the commonly used data fusion frameworks is presented together with important factors that need to be considered during the development of an effective data fusion problem-solving strategy. A system-based approach is defined for the application of data fusion systems within engineering. Structured guidelines for users are proposed.

Holographic deformation measurements by Fourier transform technique with automatic phase unwrapping

Abstract: A carrier fringe technique for measuring surface deformation is described and verified by experiments. In contrast to conventional holography and fringe analysis, this holographic system is based on fiber optics and automatic spatial carrier fringe pattern analysis techniques. Single-mode optical fibers are used to transfer both the object and reference beams. Carrier fringes are generated by simply translating the object beam between two exposures. The fast Fourier transform method is used to process the interferograms. The experiment gives an example of the tile-level minimum spanning tree phase unwrapping technique and introduces a new pixel-level noise immune unwrapping strategy also based on minimum spanning trees. The test object is a centrally loaded disk. An excellent correlation between the theoretical deformation profile and that suggested by the technique is given.

Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry

Abstract: A fast-Fourier-transform method of topography and interferometry is proposed. By computer processing of a noncontour type of fringe pattern, automatic discrimination is achieved between elevation and depression of the object or wave-front form, which has not been possible by the fringe-contour-generation techniques. The method has advantages over moire topography and conventional fringe-contour interferometry in both accuracy and sensitivity. Unlike fringe-scanning techniques, the method is easy to apply because it uses no moving components.

Digital wavefront measuring interferometer for testing optical surfaces and lenses

Abstract: A self-scanned 1024 element photodiode array and minicomputer are used to measure the phase (wavefront) in the interference pattern of an interferometer to lambda/100. The photodiode array samples intensities over a 32 x 32 matrix in the interference pattern as the length of the reference arm is varied piezoelectrically. Using these data the minicomputer synchronously detects the phase at each of the 1024 points by a Fourier series method and displays the wavefront in contour and perspective plot on a storage oscilloscope in less than 1 min (Bruning et al. Paper WE16, OSA Annual Meeting, Oct. 1972). The array of intensities is sampled and averaged many times in a random fashion so that the effects of air turbulence, vibrations, and thermal drifts are minimized. Very significant is the fact that wavefront errors in the interferometer are easily determined and may be automatically subtracted from current or subsequent wavefrots. Various programs supporting the measurement system include software for determining the aperture boundary, sum and difference of wavefronts, removal or insertion of tilt and focus errors, and routines for spatial manipulation of wavefronts. FFT programs transform wavefront data into point spread function and modulus and phase of the optical transfer function of lenses. Display programs plot these functions in contour and perspective. The system has been designed to optimize the collection of data to give higher than usual accuracy in measuring the individual elements and final performance of assembled diffraction limited optical systems, and furthermore, the short loop time of a few minutes makes the system an attractive alternative to constraints imposed by test glasses in the optical shop.

Atomization and Sprays

Abstract: Preface 1.General Considerations 2.Basic Processes in Atomization 3.Drop Size Distributions of Sprays 4.Atomizers 5.Flow in Atomizers 6.Atomizer Performance 7.External Spray Charcteristics 8.Drop Evaporation 9.Drop Sizing Methods Index