Peter S. Rostler

Bio: Peter S. Rostler is an academic researcher from Avco. The author has contributed to research in topics: Signal & Interferometry. The author has an hindex of 6, co-authored 6 publications receiving 87 citations.

Process control system using polarizing interferometer

Abstract: A system for non-destructively measuring an object and controlling industrial processes in response to the measurement is disclosed in which an impulse laser generates a plurality of sound waves over timed increments in an object. A polarizing interferometer is used to measure surface movement of the object caused by the sound waves and sensed by phase shifts in the signal beam. A photon multiplier senses the phase shift and develops an electrical signal. A signal conditioning arrangement modifies the electrical signals to generate an average signal correlated to the sound waves which in turn is correlated to a physical or metallurgical property of the object, such as temperature, which property may then be used to control the process. External, random vibrations of the workpiece are utilized to develop discernible signals which can be sensed in the interferometer by only one photon multiplier. In addition the interferometer includes an arrangement for optimizing its sensitivity so that movement attributed to various waves can be detected in opaque objects. The interferometer also includes a mechanism for sensing objects with rough surfaces which produce speckle light patterns. Finally the interferometer per se, with the addition of a second photon multiplier is capable of accurately recording beam length distance differences with only one reading.

Apparatus for measuring surface movement of an object that is subjected to external vibrations

Abstract: A system for non-destructively measuring an object and controlling industrial processes in response to the measurement is disclosed in which an impulse laser generates a plurality of sound waves over timed increments in an object. A polarizing interferometer is used to measure surface movement of the object caused by the sound waves and sensed by phase shifts in the signal beam. A photon multiplier senses the phase shift and develops an electrical signal. A signal conditioning arrangement modifies the electrical signals to generate an average signal correlated to the sound waves which in turn is correlated to a physical or metallurgical property of the object, such as temperature, which property may then be used to control the process. External, random vibrations of the workpiece are utilized to develop discernible signals which can be sensed in the interferometer by only one photon multiplier. In addition the interferometer includes an arrangement for optimizing its sensitivity so that movement attributed to various waves can be detected in opaque objects. The interferometer also includes a mechanism for sensing objects with rough surfaces which produce speckle light patterns. Finally the interferometer per se, with the addition of a second photon multiplier is capable of accurately recording beam length distance differences with only one reading.

Polarizing optical interferometer having a dual use optical element

Abstract: A system for non-destructively measuring an object and controlling industrial processes in response to the measurement is disclosed in which an impulse laser generates a plurality of sound waves over timed increments in an object. A polarizing interferometer is used to measure surface movement of the object caused by the sound waves and sensed by phase shifts in the signal beam. A photon multiplier senses the phase shift and develops an electrical signal. A signal conditioning arrangement modifies the electrical signals to generate an average signal correlated to the sound waves which in turn is correlated to a physical or metallurgical property of the object, such as temperature, which property may then be used to control the process. External, random vibrations of the workpiece are utilized to develop discernible signals which can be sensed in the interferometer by only one photon multiplier. In addition the interferometer includes an arrangement for optimizing its sensitivity so that movement attributed to various waves can be detected in opaque objects. The interferometer also includes a mechanism for sensing objects with rough surfaces which produce speckle light patterns. Finally the interferometer per se, with the addition of a second photon multiplier is capable of accurately recording beam length distance differences with only one reading.

Furnace control apparatus using polarizing interferometer

Abstract: A system for non-destructively measuring an object and controlling industrial processes in response to the measurement is disclosed in which an impulse laser generates a plurality of sound waves over timed increments in an object. A polarizing interferometer is used to measure surface movement of the object caused by the sound waves and sensed by phase shifts in the signal beam. A photon multiplier senses the phase shift and develops an electrical signal. A signal conditioning arrangement modifies the electrical signals to generate an average signal correlated to the sound waves which in turn is correlated to a physical or metallurgical property of the object, such as temperature, which property may then be used to control the process. External, random vibrations of the workpiece are utilized to develop discernible signals which can be sensed in the interferometer by only one photon multiplier. In addition the interferometer includes an arrangement for optimizing its sensitivity so that movement attributed to various waves can be detected in opaque objects. The interferometer also includes a mechanism for sensing objects with rough surfaces which produce speckle light patterns. Finally the interferometer per se, with the addition of a second photon multiplier is capable of accurately recording beam length distance differences with only one reading.

Method and apparatus for measuring surface movement of a solid object that is subjected to external vibrations

Abstract: A system for non-destructively measuring an object and controlling industrial processes in response to the measurement is disclosed in which an impulse laser generates a plurality of sound waves over timed increments in an object. A polarizing interferometer is used to measure surface movement of the object caused by the sound waves and sensed by phase shifts in the signal beam. A photon multiplier senses the phase shift and develops an electrical signal. A signal conditioning arrangement modifies the electrical signals to generate an average signal correlated to the sound waves which in turn is correlated to a physical or metallurgical property of the object, such as temperature, which property may then be used to control the process. External, random vibrations of the workpiece are utilized to develop discernible signals which can be sensed in the interferometer by only one photon multiplier. In addition the interferometer includes an arrangement for optimizing its sensitivity so that movement attributed to various waves can be detected in opaque objects. The interferometer also includes a mechanism for sensing objects with rough surfaces which produce speckle light patterns. Finally the interferometer per se, with the addition of a second photon multiplier is capable of accurately recording beam length distance differences with only one reading.

Ultrasonic impact methods for treatment of welded structures

Abstract: This invention provides methods of treatment for work products of materials such as steel, bronze, plastic, etc. and particularly welded steel bodies by pulse impact energy, preferably ultrasonic, to relax fatigue and aging and extend expectant life. The treatment may occur (a) at original production, (b) during the active life period for maintenance or (c) after failure in a repair stage. The ultrasonic treatment improves the work product strength. In welded products residual stress patterns near the weld sites are relaxed and micro-stress defects such as voids and unusual grain boundaries are reduced. The basic method steps are non-destructive in nature, inducing interior pulse compression waves with ultrasonic transducers and accessory tools impacting an external product surface with enough impulse energy to heat and temporarily plasticize the metal interior and relax stresses. The nature of the work product interior structure being treated is determined by sensing the mechanical movement at the impact surface of the work body to produce feedback frequency and phase signals responsive to input impact signals. These signals automatically conform driving pulse energy frequency and phase to the input transducers to match the mechanical resonance frequency of the working transducers and increase efficiency of energy transfer. Such feedback signals also are available for automated procedures which can improve product quality and consistency.

Laser-ultrasound spectroscopy apparatus and method with detection of shear resonances for measuring anisotropy, thickness, and other properties

Abstract: Apparatus and method for detecting shear resonances includes structure and steps for applying a radiation pulse from a pulsed source of radiation to an object to generate elastic waves therein, optically detecting the elastic waves generated in the object, and analyzing the elastic waves optically detected in the object. These shear resonances, alone or in combination with other information, may be used in the present invention to improve thickness measurement accuracy and to determine geometrical, microstructural, and physical properties of the object. At least one shear resonance in the object is detected with the elastic waves optically detected in the object. Preferably, laser-ultrasound spectroscopy is utilized to detect the shear resonances.

Method and apparatus for optical interferometric measurements with reduced sensitivity to vibration

Abstract: A method and system for providing interferometric measurements having reduced sensitivity to vibrations. An interference pattern from an interferometer (35) is amplitude split into first and second interferograms and imaged onto first and second detectors (10,11), respectively, such as CCD cameras (10,11). The two cameras (10,11) have different data acquisition rates, such as a fast:slow camera ratio of at least 2:1, and are so disposed such that the image fields substantially overlap and are synchronized with each other so that the frame integration periods are identical and overlap in time. During data acquisition a phase shifter (45) changes the phase difference between the beams in the interferometer (35) while data from both cameras (10,11) is taken by a frame grabber (15) and saved in a computer (25). During data analysis, the phase at each image point on each frame of the fast data set is calculated by the computer (25), with the phase difference between interferograms in the slow data set being determined from the phases derived from the fast data set and with the slow data set then being analyzed for phase at each image point using the measured phase increments.

Film thickness mapping using interferometric spectral imaging

Abstract: A method of determining the thickness map of a film (14) overlying a substrate (14). This method includes illuminating (10) the film simultaneously from different angles and analyzing spectral intensity of the radiation reflected by each point on the film (14). The analysis is effected by collecting reflected radiation from the film (14), passing the radiation through an interferometer (16) which outputs modulated radiation corresponding to a predetermined set of linear combinations of the spectral intensity of the radiation emitted from each pixel, simultaneously and separately scanning optical path differences generated in the interferometer (16) for each pixel, focusing the radiation outputted from the interferometer (16) on a detector array, and processing the output of the detector array to determine the spectral intensity of each pixel thereof to obtain a spectral intensity distribution. Finally, the method includes further processing the spectral intensity distribution to determine the spatial distribution of the thickness of the film (16).