P
Pietro Ferraro
Researcher at National Research Council
Publications - 720
Citations - 14634
Pietro Ferraro is an academic researcher from National Research Council. The author has contributed to research in topics: Digital holography & Holography. The author has an hindex of 61, co-authored 653 publications receiving 12666 citations. Previous affiliations of Pietro Ferraro include Aeritalia & Centre national de la recherche scientifique.
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SPADEDH: a sparsity-based denoising method of digital holograms without knowing the noise statistics
Pasquale Memmolo,Inaki Esnaola,Andrea Finizio,Melania Paturzo,Pietro Ferraro,Antonia M. Tulino +5 more
TL;DR: This paper proposes a robust method to suppress the noise components in digital holography (DH), called SPADEDH (SPArsity DEnoising of Digital Holograms), that does not consider any prior knowledge or estimation about the statistics of the noise.
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Controlling depth of focus in 3D image reconstructions by flexible and adaptive deformation of digital holograms
TL;DR: It is shown here that through an adaptive deformation of digital holograms it is possible to manage the depth of focus in 3D imaging reconstruction and extend the Depth of field having a tilted object entirely in focus.
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Creating an extended focus image of a tilted object in Fourier digital holography
Melania Paturzo,Pietro Ferraro +1 more
TL;DR: It is demonstrated that it is possible to recover the extended focus image (EFI) of a tilted object in a single reconstruction step from the deformed hologram.
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Clear coherent imaging in turbid microfluidics by multiple holographic acquisitions
Vittorio Bianco,Melania Paturzo,Andrea Finizio,Donatella Balduzzi,Roberto Puglisi,Andrea Galli,Pietro Ferraro +6 more
TL;DR: This Letter exploits the Brownian motion of the colloidal particles to get multiple uncorrelated holograms, and combines them to reduce the speckle contrast, to get a multi-look gain without losing image resolution.
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Evaluation of the internal field in lithium niobate ferroelectric domains by an interferometric method
M. de Angelis,S. De Nicola,Andrea Finizio,Giovanni Pierattini,Pietro Ferraro,Simonetta Grilli,Melania Paturzo +6 more
TL;DR: In this article, the authors evaluated the internal electric field of a ferroelectric engineered-domain in a LiNbO3 wafer crystal by detecting optical path length variation with a noninvasive interferometric interferometry.