Pranab Kumar Sarkar

Bio: Pranab Kumar Sarkar is an academic researcher from Assam University. The author has contributed to research in topics: Resistive random-access memory & Perovskite (structure). The author has an hindex of 12, co-authored 38 publications receiving 357 citations. Previous affiliations of Pranab Kumar Sarkar include National Institute of Technology, Silchar.

Incorporation of SnO2 nanoparticles in PMMA for performance enhancement of a transparent organic resistive memory device

Abstract: We report the electrical bistable characteristics of a hybrid polymer/inorganic nanocomposite device consisting of SnO2 nanoparticles (NPs) embedded in an insulating polymethylmethacrylate (PMMA) layer sandwiched between conductive indium tin oxide (ITO) and aluminium (Al) electrodes. X-ray diffraction measurements were performed for assessment of the crystallographic nature of SnO2 nanoparticles while the microstructural nature of SnO2 nanoparticles embedded in the PMMA matrix was confirmed using transmission electron microscopy. Detailed electrical characterizations suggested an influence of the NP concentration on the switching characteristics of the Al/SnO2-PMMA/ITO memory devices. The highest resistance ratio > 103 (Roff/Ron) was observed in a device with 2 weight% SnO2 NPs. The retention tests on the fabricated device demonstrated the consistency in current of the ON/OFF state even after 104 s. The conduction mechanisms of the fabricated nanocomposite based memory cell were discussed on the basis of experimental data using a charge trapping–detrapping mechanism in the NPs. Our findings offer a feasible and low cost chemical approach to fabricate a transparent and high density RS memory device.

Compliance Current-Dependent Dual-Functional Bipolar and Threshold Resistive Switching in All-Inorganic Rubidium Lead-Bromide Perovskite-Based Flexible Device

Abstract: All-inorganic halide perovskites are considered as favorable materials for various electronic applications because of their superior functionality and stability. In this study, the inorganic rubidi...

Nonvolatile resistive switching and synaptic characteristics of lead-free all-inorganic perovskite-based flexible memristive devices for neuromorphic systems

Abstract: Recently, several types of lead halide perovskites have been actively researched for resistive switching (RS) memory or artificial synaptic devices due to their current–voltage hysteresis along with the feasibility of fabrication, low-temperature processability and superior charge mobility. However, the toxicity and environmental pollution potential of lead halide perovskites severely restrict their large-scale commercial prospects. In the present work, the environmentally friendly and uniform CsSnCl3 perovskite films are introduced to act as an active layer in the flexible memristors. Ag/CsSnCl3/ITO devices demonstrate bipolar RS with excellent electrical properties such as forming free characteristics, good uniformity, low operating voltages, a high ON/OFF ratio (102) and a long retention time (>104 s). The RS mechanism has been well explained in the outline of electric field-induced formation and rupture of Ag filaments in the CsSnCl3 layer. The metallic nature of the conducting filament has been further confirmed by temperature-dependent variation of low and high resistance states. Additionally, various pulse measurements have been carried out to mimic some of the basic synaptic functions including postsynaptic current, paired-pulse facilitation, long-term potentiation and long-term depression under normal as well as bending conditions. Our work provides the opportunity for exploring artificial synapses based on lead-free halide perovskites for the development of next-generation flexible electronics.

Multilevel programming in Cu/NiO y /NiO x /Pt unipolar resistive switching devices.

Abstract: The application of a NiO y /NiO x bilayer in resistive switching (RS) devices with x > y was studied for its ability to achieve reliable multilevel cell (MLC) characteristics. A sharp change in resistance brought about by sweeping the voltage, along with an improved on/off ratio (>103) and endurance (104) were achieved in the bilayer structure as compared to the single NiO x layer devices. Moreover, it was found that nonvolatile and stable resistance levels, especially the multiple low-resistance states of Cu/NiO y /NiO x /Pt memory devices, could be controlled by varying the compliance current. All the multilevel resistance states of the Cu/NiO y /NiO x /Pt bilayer devices were stable for up to 500 consecutive dc switching cycles, as compared to the Cu/NiO x /Pt single layer devices. The temperature-dependent variation of the high and low resistance states of both the bilayer and single layer devices was further investigated to elucidate the charge conduction mechanism. Finally, based on a detailed analysis of the experimental results, comparisons of the possible models for RS in bilayer and single layer memory devices have also been discussed.

Electrical reliability, multilevel data storage and mechanical stability of MoS2-PMMA nanocomposite-based non-volatile memory device

Abstract: Molybdenum disulfide (MoS2) is of great interest for its applicability in various optoelectronic devices. Here we report the resistive switching properties of polymethylmethacrylate embedding MoS2 nano-crystals. The devices are developed on an ITO-coated PET substrate with copper as the top electrode. Systematic evaluation of resistive switching parameters, on the basis of MoS2 content, suggests non-volatile memory characteristics. A decent ON/OFF ratio, high retention time and long endurance of 3 × 103, 105 s and 105 cycles are respectively recorded in a device with 1 weight percent (wt%) of MoS2. The bending cyclic measurements confirm the flexibility of the memory devices with good electrical reliability as well as mechanical stability. In addition, multilevel storage has been demonstrated by controlling the current compliance and span of voltage sweeping in the memory device.

Random circuit breaker network model for unipolar resistance switching (Advanced Materials (2008) 20 (1154))

Abstract: The existence of reversible resistance switching (RS) behaviors induced by electric stimulus has been known for some time, and these intriguing physical phenomena have been observed in numerous materials, including oxides. As conventional charge-based random access memory is expected to face a size limit in the near future, a surge of renewed interest has been developed in RS phenomena for possible applications in small nonvolatile memory devices called resistance random access memory (RRAM). Of particular interest is unipolar RS, which shows the RS at two values of applied voltage of the same polarity. The unipolar RS exhibits a much larger resistance change than other RS phenomena, and this greatly simplifies the process of reading the memory state. When fabricated with oxide p-n diodes, memory cells using unipolar RS can be stacked vertically, which has the potential for dramatically increasing memory density. Therefore, unipolar RRAM may be a good candidate for multi-stacked, high density, nonvolatile memory. The most important scientific and technical issues concerning unipolar RS are how it works and the identification of its controlling parameters. Some studies have reported that unipolar RS comes from a homogeneous/inhomogeneous transition of current distribution, while others maintain that it comes from the formation and rupture of conducting filaments. Even with recent extensive studies on unipolar RS, its basic origin is still far from being understood. In addition, no model exists that actually explains how the reversible switching can occur at two values of applied voltage. This lack of a quantitative model poses a major barrier for unipolar RRAM applications. In this study, we describe RS behavior in polycrystalline TiO2 film. To explain the basic mechanism of unipolar RS behavior, we propose a new percolation model based on a network of ‘‘circuit breakers’’ with two switchable metastable states. The random circuit breaker (RCB) network model can explain the long-standing material issue of how unipolar RS occurs. This simple percolation model is different from the conventional percolation models, which have dealt only with static or irreversible dynamic processes. In addition, the RCB network model provides an indication of how to overcome the substantial distribution of switching voltages, which is currently considered the most serious obstacle to practical unipolar RRAM applications. The unipolar RS phenomenon can be explained by the current (I)-voltage (V) curves in Figure 1a, which are derived from measurements of our polycrystalline TiO2 thin capacitors. At the pristine state (green dot), they are in an insulating state. As the external voltage Vext increases from zero and reaches a threshold voltage Vforming, a sudden increase occurs in the current. If the current is not limited to a certain value, here called the compliance current Icomp, the TiO2 capacitor would experience a dielectric breakdown and be destroyed. However, [*] Prof. T. W. Noh, S. C. Chae, S. B. Lee, S. H Chang, Dr. C. Liu ReCOE & FPRD, Department of Physics and Astronomy Seoul National University Seoul 151-747 (Korea) E-mail: twnoh@snu.ac.kr

The formation and detection techniques of oxygen vacancies in titanium oxide-based nanostructures.

Abstract: TiO2 and other titanium oxide-based nanomaterials have drawn immense attention from researchers in different scientific domains due to their fascinating multifunctional properties, relative abundance, environmental friendliness, and bio-compatibility. However, the physical and chemical properties of titanium oxide-based nanomaterials are found to be explicitly dependent on the presence of various crystal defects. Oxygen vacancies are the most common among them and have always been the subject of both theoretical and experimental research as they play a crucial role in tuning the inherent properties of titanium oxides. This review highlights different strategies for effectively introducing oxygen vacancies in titanium oxide-based nanomaterials, as well as a discussion on the positions of oxygen vacancies inside the TiO2 band gap based on theoretical calculations. Additionally, a detailed review of different experimental techniques that are extensively used for identifying oxygen vacancies in TiO2 nanostructures is also presented.

Flexible Molybdenum Disulfide (MoS2) Atomic Layers for Wearable Electronics and Optoelectronics

Abstract: Flexible, stretchable, and bendable materials, including inorganic semiconductors, organic polymers, graphene, and transition metal dichalcogenides (TMDs), are attracting great attention in such areas as wearable electronics, biomedical technologies, foldable displays, and wearable point-of-care biosensors for healthcare. Among a broad range of layered TMDs, atomically thin layered molybdenum disulfide (MoS2) has been of particular interest, due to its exceptional electronic properties, including tunable bandgap and charge carrier mobility. MoS2 atomic layers can be used as a channel or a gate dielectric for fabricating atomically thin field-effect transistors (FETs) for electronic and optoelectronic devices. This review briefly introduces the processing and spectroscopic characterization of large-area MoS2 atomically thin layers. The review summarizes the different strategies in enhancing the charge carrier mobility and switching speed of MoS2 FETs by integrating high-κ dielectrics, encapsulating layers, and other 2D van der Waals layered materials into flexible MoS2 device structures. The photoluminescence (PL) of MoS2 atomic layers has, after chemical treatment, been dramatically improved to near-unity quantum yield. Ultraflexible and wearable active-matrix organic light-emitting diode (AM-OLED) displays and wafer-scale flexible resistive random-access memory (RRAM) arrays have been assembled using flexible MoS2 transistors. The review discusses the overall recent progress made in developing MoS2 based flexible FETs, OLED displays, nonvolatile memory (NVM) devices, piezoelectric nanogenerators (PNGs), and sensors for wearable electronic and optoelectronic devices. Finally, it outlines the perspectives and tremendous opportunities offered by a large family of atomically thin-layered TMDs.

Electrically tunable surface-to-bulk coherent coupling in topological insulator thin films

Abstract: We study coherent electronic transport in charge-density-tunable microdevices patterned from thin films of the topological insulator (TI) Bi${}_{2}$Se${}_{3}$. The devices exhibit pronounced electric field effect, including ambipolar modulation of the resistance with an on-and-off ratio of 500%. We show that the weak antilocalization correction to conductance is sensitive to the number of coherently coupled channels, which in a TI includes the top and bottom surfaces and the bulk carriers. These are separated into coherently independent channels by the application of gate voltage and at elevated temperatures. Our results are consistent with a model where channel separation is determined by a competition between the phase coherence time and the surface-to-bulk scattering time.

Nonvolatile Memories Based on Graphene and Related 2D Materials.

Abstract: The pervasiveness of information technologies is generating an impressive amount of data, which need to be accessed very quickly. Nonvolatile memories (NVMs) are making inroads into high-capacity storage to replace hard disk drives, fuelling the expansion of the global storage memory market. As silicon-based flash memories are approaching their fundamental limit, vertical stacking of multiple memory cell layers, innovative device concepts, and novel materials are being investigated. In this context, emerging 2D materials, such as graphene, transition metal dichalcogenides, and black phosphorous, offer a host of physical and chemical properties, which could both improve existing memory technologies and enable the next generation of low-cost, flexible, and wearable storage devices. Herein, an overview of graphene and related 2D materials (GRMs) in different types of NVM cells is provided, including resistive random-access, flash, magnetic and phase-change memories. The physical and chemical mechanisms underlying the switching of GRM-based memory devices studied in the last decade are discussed. Although at this stage most of the proof-of-concept devices investigated do not compete with state-of-the-art devices, a number of promising technological advancements have emerged. Here, the most relevant material properties and device structures are analyzed, emphasizing opportunities and challenges toward the realization of practical NVM devices.