Rajesh Mehra

Bio: Rajesh Mehra is an academic researcher. The author has contributed to research in topics: Low-power electronics & Transistor. The author has an hindex of 1, co-authored 1 publications receiving 13 citations.

Low-power and high-speed 13T SRAM cell using FinFETs

Abstract: Fin field-effect transistors (FinFETs) are replacing the traditional planar metal-oxide-semiconductor FETs (MOSFETs) because of superior capability in controlling short channel effects, leakage current, propagation delay, and power dissipation. Planar MOSFETs face the problem of process variability but the FinFETs mitigate the device-performance variability due to number of dopant ions. This work includes the design of static-random access memory (SRAM) cell using FinFETs. The performance analysis of the ST11T, proposed ST13T SRAM cell, and with power gating sleep transistors is given in this study using the Cadence Virtuoso Tool (V.6.1). Owing to its improved gate controllability and scalability, the FinFET transistor structure is better than the conventional planar complementary MOS technology. The proposed design aims at the power reduction and speed improvement for the SRAM cell. From the result it is clear that optimised proposed FinFET-based ST13T SRAM cell is 92% more power efficient with the use of power gating technique, i.e. sleep transistors approach and having 12.84% less delay due to the use of transmission gates in the access path.

Transmission gate-based 9T SRAM cell for variation resilient low power and reliable internet of things applications

Abstract: Higher variation resilience, lower power consumption, and higher reliability are the three principal design metrics for designing a static random-access memory (SRAM) cell. The most intuitive way to achieve lower power consumption is voltage scaling. However, voltage scaling at nanometre technology nodes leads to degradation in the robustness of the SRAM cell and decreased data stability. It is proved that conventional 6T SRAM fails to maintain its stability in scaled technology, particularly in the deep-subthreshold regime. Furthermore, SRAM cells utilising techniques such as read decoupling, for achieving reliable read operation, tend to increase leakage current resulting in higher hold power, which contributes a major portion to the total power consumption in modern internet of things devices. To cater to the requirements of higher robustness and lower hold power dissipation, a transmission gate-based 9T SRAM is proposed, which achieves these requirements at the cost of slightly higher read and write access time. The simulations are performed utilising a 16-nm complementary metal oxide semiconductor model.

A single-ended low leakage and low voltage 10T SRAM cell with high yield

Abstract: This paper presents a low leakage power 10T single-ended SRAM cell in the sub-threshold region that improves read, write, and hold stability. While at low voltages, the write-ability is increased by temporarily floating the data node, the read stability of the cell is maintained approximately as equal as the hold state by separating the data-storage node from the read bit line by using only a single transistor. According to Simulations using HSPICE software in 10 nm FinFET technology, the read stability of the proposed cell is approximately 4.8× higher than the conventional 6T at 200 mV. Furthermore, the proposed cell is found to have the lowest static power dissipation, as it tends to be 4% lower than the standard six-transistor cell at this voltage. This study shows that the yield of the proposed cell is higher than 6σ in all operations, and supply voltages down to 200 mV.

Sleepy CMOS-Sleepy Stack (SC-SS): A Novel High Speed, Area and Power Efficient Technique for VLSI Circuit Design

Abstract: This paper presents a novel ultra-low-power Sleepy CMOS-Sleepy Stack (SC-SS) technique for nano scale VLSI technologies. Eight prior techniques are taken for comparison with proposed technique on 6...

Modelling for triple gate spin-FET and design of triple gate spin-FET-based binary adder

Abstract: In this study, an InAs channel-based triple gate spin-field effect transistor (FET) model is proposed. The proposed triple-gate spin-FET offers a high density of integration, consumes low power and offers very high switching speed. By incorporating the suitable parameters like channel length, spin diffusion length, channel resistance and junction polarisation, the modelled triple gate spin-FET is then used to implement 3-input XOR, 3-input XNOR and majority gate functions. The designs of 3-input XOR and majority gates were achieved keeping in view that the sum operation of a 1-bit full adder is obtained through XOR gate and the carry operation of 1-bit full adder is obtained through majority gate. Therefore, for designing a 1-bit full adder, only two spin-FETs will be required which signifies the compact nature of the design. In addition, a 2-bit ripple adder is designed with cascading two 1-bit full-adders. Finally, a comparative analysis of the proposed gates and 1-bit full adder with the reported work and conventional CMOS design was carried out in terms of employed number of devices, power consumption and speed. The analysis shows that proposed gates/adder offer better performance than the reported work and conventional CMOS designs.