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Ralf K. Heilmann

Researcher at Massachusetts Institute of Technology

Publications -  173
Citations -  2983

Ralf K. Heilmann is an academic researcher from Massachusetts Institute of Technology. The author has contributed to research in topics: Grating & Diffraction grating. The author has an hindex of 28, co-authored 166 publications receiving 2668 citations. Previous affiliations of Ralf K. Heilmann include University of Virginia & University of Arizona.

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Proceedings ArticleDOI

Raytracing with MARX: x-ray observatory design, calibration, and support

TL;DR: The MARX ray-trace program was originally developed to simulate event data from the trans-mission grating spectrometers on-board the Chandra X-ray Observatory (CXO) as mentioned in this paper.
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Analyses of vector Gaussian beam propagation and the validity of paraxial and spherical approximations.

TL;DR: In this article, the angular spectrum of a Gaussian beam is represented as a power-series expansion, where the higher-order terms diverge at locations that are sufficiently far from the initial boundary, yielding unphysical results.
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Dimensional metrology for nanometre-scale science and engineering: towards sub-nanometre accurate encoders

TL;DR: In this article, the nanoruler was used to develop grating-and grid-based scales with sub-nanometre accuracy over 300mm dimensions using the scanning-beam interference lithography tool.
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Fabrication of ultrahigh aspect ratio freestanding gratings on silicon-on-insulator wafers

TL;DR: In this paper, a silicon-on-insulator (SOI) process was used for the fabrication of ultra-high aspect ratio freestanding gratings for high efficiency x-ray and extreme ultraviolet spectroscopy.