R
Robert B. Von Dreele
Researcher at Argonne National Laboratory
Publications - 54
Citations - 5012
Robert B. Von Dreele is an academic researcher from Argonne National Laboratory. The author has contributed to research in topics: Powder diffraction & Rietveld refinement. The author has an hindex of 22, co-authored 54 publications receiving 3612 citations. Previous affiliations of Robert B. Von Dreele include Los Alamos National Laboratory.
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GSAS-II: the genesis of a modern open-source all purpose crystallography software package
TL;DR: The newly developed GSAS-II software is a general purpose package for data reduction, structure solution and structure refinement that can be used with both single-crystal and powder diffraction data from both neutron and X-ray sources, including laboratory and synchrotron sources, collected on both two- and one-dimensional detectors.
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A dedicated powder diffraction beamline at the Advanced Photon Source: Commissioning and early operational results
Jun Wang,Brian H. Toby,Peter L. Lee,Lynn Ribaud,Sytle M. Antao,C. Kurtz,Mohan Ramanathan,Robert B. Von Dreele,Mark A. Beno +8 more
TL;DR: A new dedicated high-resolution high-throughput powder diffraction beamline has been built, fully commissioned, and opened to general users at the Advanced Photon Source.
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A twelve-analyzer detector system for high-resolution powder diffraction
Peter L. Lee,Deming Shu,Mohan Ramanathan,Curt Preissner,Jun Wang,Mark A. Beno,Robert B. Von Dreele,Lynn Ribaud,C. Kurtz,Sytle M. Antao,Xuesong Jiao,Brian H. Toby +11 more
TL;DR: The design and performance of the 12-analyzer detector system installed on the powder diffractometer at the 11-BM beamline of APS are presented.
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Texture measurements using the new neutron diffractometer HIPPO and their analysis using the Rietveld method
Sven C. Vogel,Christian Hartig,Luca Lutterotti,Robert B. Von Dreele,Hans-Rudolf Wenk,Darrick J. Williams +5 more
TL;DR: In this article, the orientation distribution function (ODF) is extracted from multiple neutron time-of-flight histograms using the full-pattern analysis first described by Rietveld.
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Neutron and temperature-resolved synchrotron X-ray powder diffraction study of akaganéite
TL;DR: Rietveld refinements using neutron powder diffraction data were used to locate H atom positions and obtain a more precise crystal structure refinement for akaganeite [Fe3+7.6Ni2+0.4O6.35(OH)9.65Cl1.25· n H2O] as discussed by the authors.