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Robert H. Siemann

Researcher at Stanford University

Publications -  154
Citations -  3352

Robert H. Siemann is an academic researcher from Stanford University. The author has contributed to research in topics: Particle accelerator & Plasma acceleration. The author has an hindex of 25, co-authored 154 publications receiving 3140 citations. Previous affiliations of Robert H. Siemann include University of Southern California & Cornell University.

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Energy doubling of 42 GeV electrons in a metre-scale plasma wakefield accelerator

TL;DR: An energy gain of more than 42 GeV is achieved in a plasma wakefield accelerator of 85 cm length, driven by a 42‬GeV electron beam at the Stanford Linear Accelerator Center (SLAC), in excellent agreement with the predictions of three-dimensional particle-in-cell simulations.
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Multi-GeV energy gain in a plasma-wakefield accelerator.

TL;DR: A plasma-wakefield accelerator has accelerated particles by over 2.7 GeV in a 10 cm long plasma module, driving a large amplitude plasma wake that in turn accelerates particles in the back of the bunch by more than 2.8 GeV.
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Electron scattering at 4° with energies of 4.5-20 GeV

TL;DR: In this paper, the authors present the results of the analysis of a single-arm inelastic-electron-scattering experiment at an angle of 4.5mm.
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Ionization-induced electron trapping in ultrarelativistic plasma wakes

TL;DR: The experimentally inferred trapping threshold is at a wake amplitude of 36 GV/m, in good agreement with an analytical model and PIC simulations, and the onset of trapping of electrons born inside a highly relativistic, 3D beam-driven plasma wake is investigated.
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Breakdown limits on Gigavolt-per-meter electron-beam-driven wakefields in dielectric structures.

TL;DR: First measurements of the breakdown threshold in a dielectric subjected to GV/m wakefields produced by short (30-330 fs), 28.5 GeV electron bunches have been made and correlation of structure damage to beam-induced breakdown is established using an array of postexposure inspection techniques.